S. Wu

Whole-field residual stress measurement in rail using moiré interferometry and twyman/green interferometry via thermal annealing

Fu-Pen Chiang, F. Chiang, B. Wang, 1999 .

Measurement of Wafer Surface Using Shadow Moiré Technique With Talbot Effect

Fu-Pen Chiang, I. Kao, F. Chiang, 1998 .

Homoepitaxial HVPE GaN: A potential substrate for high performance devices

M. Boćkowski, M. Dudley, S. Wu, 2018, Journal of Crystal Growth.