M. Ohlídal

发表

IV: Scattering of Light from Multilayer Systems With Rough Boundaries

Miloslav Ohlídal, Ivan Ohlídal, Karel Navrátil, 1995 .

Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry

I. Ohlídal, A. Majumdar, M. Ohlídal, 2015 .

Optical Characterization of Thin Films by Means of Imaging Spectroscopic Reflectometry

M. Ohlídal, D. Nečas, J. Vodák, 2018 .

Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy

P. Pokorný, I. Ohlídal, M. Ohlídal, 2001 .

Influence of technological conditions on mechanical stresses inside diamond-like carbon films

I. Ohlídal, M. Ohlídal, V. Buršíková, 2005 .

Measurement of the thickness distribution and optical constants of non-uniform thin films

I. Ohlídal, M. Ohlídal, D. Nečas, 2011 .

Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films

I. Ohlídal, M. Ohlídal, D. Nečas, 2009 .

Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry

M. Ohlídal, J. Benedikt, L. Zajíčková, 2014 .

Stable a-CSi:H films with a wide range of modulus of elasticity and low internal stress

M. Ohlídal, Václav Šulc, V. Čech, 2022, Surface and Coatings Technology.