B. Fodor

发表

Optical characterization of macro-, micro- and nanostructures using polarized light

Silvania F. Pereira, C. Major, Peter Petrik, 2014 .

Near-infrared optical properties and proposed phase-change usefulness of transition metal disulfides

Jian Zhou, B. Fodor, Yifei Li, 2019, Applied Physics Letters.

Composite polymeric-inorganic waveguide fabricated by injection molding for biosensing applications

M. Fried, P. Petrik, L. Francis, 2014, 2014 16th International Conference on Transparent Optical Networks (ICTON).

Ellipsometric study of crystalline silicon hydrogenated by plasma immersion ion implantation

P. Petrik, A. Szekeres, B. Fodor, 2013 .

Photoinduced processes of adsorbed and associated dye molecules in mesoporous titania coatings

B. Fodor, G. Sáfrán, Z. Hórvölgyi, 2019, Dyes and Pigments.

Optical polymers with tunable refractive index for nanoimprint technologies

P. Petrik, L. Frey, M. Rommel, 2014, Nanotechnology.

Grating coupled optical waveguide interferometry combined with in situ spectroscopic ellipsometry to monitor surface processes in aqueous solutions

S. Kurunczi, R. Horváth, M. Fried, 2017 .

Investigation of thin polymer layers for biosensor applications

S. Kurunczi, R. Horváth, P. Fürjes, 2013 .

Room temperature micro-photoluminescence measurements for monitoring defects in low-energy high-dose As and B implanted silicon

Edward D. Moore, Z. Zolnai, A. Pongrácz, 2021, 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).

Porosity and thickness characterization of porous Si and oxidized porous Si layers – An ultraviolet–visible–mid infrared ellipsometry study

M. Fried, P. Petrik, G. Gautier, 2016 .

Characterization of in-depth cavity distribution after thermal annealing of helium-implanted silicon and gallium nitride

M. Fried, P. Petrik, B. Fodor, 2014 .

Optical models for the characterization of silica nanosphere monolayers prepared by the Langmuir-Blodgett method using ellipsometry in the quasistatic regime.

P. Petrik, B. Fodor, P. Kozma, 2010, Langmuir : the ACS journal of surfaces and colloids.

Optical Properties of Oxidized, Hydrogenated, and Native Zirconium Surfaces for Wavelengths from 0.3 to 25 µm − A Study by Ex Situ and In Situ Spectroscopic Ellipsometry

S. Kurunczi, T. Lohner, P. Petrik, 2019, physica status solidi (a).

Methods for optical modeling and cross-checking in ellipsometry and scatterometry

H. P. Urbach, M. Fried, G. Juhasz, 2015, Optical Metrology.

Nanophotonics of biomaterials and inorganic nanostructures

S. Kurunczi, R. Horváth, T. Lohner, 2017 .

Optical characterization of laterally and vertically structured oxides and semiconductors

T. Lohner, B. Fodor, P. Petrik, 2014, Photonics West - Optoelectronic Materials and Devices.

Resolving lateral and vertical structures by ellipsometry using wavelength range scan

T. Nagata, T. Lohner, P. Petrik, 2014 .

Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires

Peter Petrik, Miklos Fried, Gaël Gautier, 2017 .

On the Rational Design of Mesoporous Silica Humidity Sensors

B. Fodor, S. Guldin, M. J. Fornerod, 2023, Advanced Sensor Research.

Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry

M. Fried, P. Petrik, M. Lemberger, 2013 .

Internal wettability investigation of mesoporous silica materials by ellipsometric porosimetry

A. Regoutz, B. Fodor, S. Guldin, 2023, Thin Solid Films.

Ammonia-vapour-induced two-layer transformation of mesoporous silica coatings on various substrates

C. Major, B. Fodor, Z. Hórvölgyi, 2021 .

Optimized plasma-polymerized fluoropolymer mask for local porous silicon formation

G. Gautier, B. Fodor, T. Defforge, 2016 .

Approaches to calculate the dielectric function of ZnO around the band gap

P. Petrik, B. Beckhoff, B. Fodor, 2014 .