P. D. Reigosa

发表

Short-Circuit Instabilities in Silicon IGBTs and Silicon Carbide Power MOSFETs

P. D. Reigosa, 2017 .

Modeling of IGBT With High Bipolar Gain for Mitigating Gate Voltage Oscillations During Short Circuit

M. Rahimo, F. Iannuzzo, P. D. Reigosa, 2019, IEEE Journal of Emerging and Selected Topics in Power Electronics.

Packaging Solutions for Mitigating IGBT Short-Circuit Instabilities

F. Blaabjerg, F. Iannuzzo, P. D. Reigosa, 2017 .

Improving the Short-Circuit Reliability in IGBTs: How to Mitigate Oscillations

F. Blaabjerg, M. Rahimo, F. Iannuzzo, 2018, IEEE Transactions on Power Electronics.

Implications of short-circuit events on power cycling of 1.2-kV/20-A SiC MOSFET power modules

Francesco Iannuzzo, Paula Diaz Reigosa, Lorenzo Ceccarelli, 2019, Microelectronics Reliability.

Failure Analysis of a Degraded 1.2 kV SiC MOSFET after Short Circuit at High Temperature

F. Iannuzzo, P. D. Reigosa, L. Ceccarelli, 2018, 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Non-uniform Temperature Distribution Implications on Thermal Analysis Accuracy of Si IGBTs and SiC MOSFETs

F. Iannuzzo, P. D. Reigosa, A. Bahman, 2018, 2018 24rd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC).

Implications of Ageing Through Power Cycling on the Short-Circuit Robustness of 1.2-kV SiC mosfets

F. Iannuzzo, Haoze Luo, P. D. Reigosa, 2019, IEEE Transactions on Power Electronics.

A Short-Circuit Safe Operation Area Identification Criterion for SiC MOSFET Power Modules

Frede Blaabjerg, Haoze Luo, Francesco Iannuzzo, 2017, IEEE Transactions on Industry Applications.

Aalborg Universitet Investigation on the degradation indicators of short-circuit tests in 1 . 2 kV SiC MOSFET power modules

Francesco Iannuzzo, Paula Diaz Reigosa, Lorenzo Ceccarelli, 2018 .

Thermal modeling of wire-bonded power modules considering non-uniform temperature and electric current interactions

Amir Sajjad Bahman, Francesco Iannuzzo, Mohsen Akbari, 2018, Microelectron. Reliab..

On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition

Frede Blaabjerg, Haoze Luo, Francesco Iannuzzo, 2018, Microelectron. Reliab..

Enhancement of Thermo-mechanical Behavior of IGBT Modules through Engineered Threshold Voltages

M. Bina, F. Iannuzzo, P. D. Reigosa, 2019, 2019 21st European Conference on Power Electronics and Applications (EPE '19 ECCE Europe).

Prediction of bond wire fatigue of IGBTs in a PV inverter under long-term operation

Frede Blaabjerg, Yongheng Yang, Huai Wang, 2016, 2015 IEEE Applied Power Electronics Conference and Exposition (APEC).

A survey of SiC power MOSFETs short-circuit robustness and failure mode analysis

Frede Blaabjerg, Francesco Iannuzzo, Paula Diaz Reigosa, 2017, Microelectron. Reliab..

Prediction of bond wire fatigue of IGBTs in a PV inverter under long-term operation

Huai Wang, Frede Blaabjerg, Yongheng Yang, 2015, 2015 IEEE Applied Power Electronics Conference and Exposition (APEC).

Effect of short-circuit stress on the degradation of the SiO2 dielectric in SiC power MOSFETs

Francesco Iannuzzo, Paula Diaz Reigosa, Lorenzo Ceccarelli, 2018, Microelectron. Reliab..

Compact electro-thermal modeling of a SiC MOSFET power module under short-circuit conditions

Frede Blaabjerg, Amir Sajjad Bahman, Francesco Iannuzzo, 2017, IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society.

Development of Simulink-based SiC MOSFET modeling platform for series connected devices

Kalle Ilves, Francesco Iannuzzo, Georgios Tsolaridis, 2016, 2016 IEEE Energy Conversion Congress and Exposition (ECCE).

Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules

F. Iannuzzo, P. D. Reigosa, L. Ceccarelli, 2018, Microelectron. Reliab..

Comparison of thermal runaway limits under different test conditions based on a 4.5 kV IGBT

Arnost Kopta, Francesco Iannuzzo, Gontran Pâques, 2016, Microelectron. Reliab..

Modern IGBT gate driving methods for enhancing reliability of high-power converters - An overview

Frede Blaabjerg, Wuhua Li, Xiangning He, 2016, Microelectron. Reliab..