F. Nallet

Silicon carbide power devices

Dominique Planson, M. L. Locatelli, Karine Isoird, 1998, 1998 International Semiconductor Conference. CAS'98 Proceedings (Cat. No.98TH8351).

Limits and improvements of TCAD piezoresistive models in FDSOI transistors

C. Tavernier, D. Rideau, R. Clerc, 2013, 2013 14th International Conference on Ultimate Integration on Silicon (ULIS).

Pinned Photodiode CMOS Image Sensor TCAD Simulation: In-Depth Analysis of in-Pixel Pinning Voltage Measurement for a Diagnostic Tool

P. Magnan, F. Nallet, V. Goiffon, 2017, IEEE Transactions on Electron Devices.

Simulation of the thermal stress induced by CW 1340 nm laser on 28 nm advanced technologies

D. Lewis, Luca Silvestri, Maxime Penzes, 2017, Microelectron. Reliab..

Mobility in high-K metal gate UTBB-FDSOI devices: From NEGF to TCAD perspectives

F. Andrieu, O. Weber, D. Esseni, 2013, 2013 IEEE International Electron Devices Meeting.