T. Basler
发表
Thomas Basler,
T. Basler,
2013
.
Roland Jakob,
Thomas Bruckner,
Josef Lutz,
2011,
Proceedings of the 2011 14th European Conference on Power Electronics and Applications.
R. Elpelt,
T. Basler,
Xing Liu,
2022,
2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD).
W. Bergner,
R. Siemieniec,
D. Peters,
2017
.
J. Lutz,
T. Basler,
2021,
Wide Bandgap Semiconductors for Power Electronics.
K. Reinhart,
T. Basler,
A. Meier‑Hellmann,
2002,
Intensive Care Medicine.
J. Lutz,
T. Basler,
E. Deng,
2021,
IEEE Transactions on Components, Packaging and Manufacturing Technology.
R. Siemieniec,
J. Lutz,
T. Basler,
2010
.
Katja Puschkarsky,
Hans Reisinger,
Thomas Basler,
2018,
2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD).
Ralf Siemieniec,
Thomas Basler,
Thomas Aichinger,
2017,
2017 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe).
Josef Lutz,
Franz-Josef Niedernostheide,
Thomas Basler,
2014,
2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD).
J. Lutz,
T. Basler,
R. Boldyrjew-Mast,
2021,
2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD).
Josef Lutz,
Thomas Basler,
R. Elpelt,
2021,
2021 IEEE International Reliability Physics Symposium (IRPS).
Ralf Siemieniec,
Thomas Basler,
Thomas Aichinger,
2017,
2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD).
T. Basler,
Xing Liu,
T. N. Wassermann,
2023,
2023 IEEE International Reliability Physics Symposium (IRPS).
J. Lutz,
Md.K. Ahmmed,
T. Basler,
2019,
Microelectronics Reliability.
J. Lutz,
R. Rupp,
T. Basler,
2018,
2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD).
R. Rupp,
T. Basler,
M. Draghici,
2016
.
T. Basler,
Xing Liu,
C. Bäumler,
2022,
2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD).
J. Lutz,
S. Palanisamy,
R. Boldyrjew-Mast,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
T. Basler,
H. Schulze,
M. Dainese,
2020,
International Symposium on Power Semiconductor Devices and IC's.
J. Lutz,
T. Basler,
Patrick Heimler,
2022,
2022 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe).
J. Lutz,
T. Basler,
H. Schwarzmann,
2021,
Microelectronics Reliability.
S. D'Arco,
Magnar Hernes,
Tilo Poller,
2012,
Microelectron. Reliab..
R. Esteve,
T. Aichinger,
W. Bergner,
2016,
2016 European Conference on Silicon Carbide & Related Materials (ECSCRM).
J. Lutz,
T. Basler,
J. Lutz,
2012,
2012 28th International Conference on Microelectronics Proceedings.
T. Basler,
Yuhua Du,
Chunxu Lin,
2024,
IEEE Transactions on Power Electronics.
Josef Lutz,
Franz-Josef Niedernostheide,
Hans-Joachim Schulze,
2014,
IET Circuits Devices Syst..