A. Guo

InGaAs MOSFETs for CMOS: Recent advances in process technology

D-H Kim, J. A. del Alamo, D. Antoniadis, 2013, 2013 IEEE International Electron Devices Meeting.

Nano-scale metal contacts for future III-V CMOS

A. Guo, 2012 .

Negative-bias temperature instability of GaN MOSFETs

Alex Guo, J. D. del Alamo, A. Guo, 2016, 2016 IEEE International Reliability Physics Symposium (IRPS).

Positive-bias temperature instability (PBTI) of GaN MOSFETs

Alex Guo, Jesús A. del Alamo, J. Alamo, 2015, 2015 IEEE International Reliability Physics Symposium.

Gate dielectric reliability and instability in GaN metal-insulator-semiconductor high-electron-mobility transistors for power electronics

Jesus A. del Alamo, Alex Guo, Shireen Warnock, 2017 .

Unified Mechanism for Positive- and Negative-Bias Temperature Instability in GaN MOSFETs

Alex Guo, J. D. del Alamo, A. Guo, 2017, IEEE Transactions on Electron Devices.

SOI TFET I_ON/I_OFF Enhancement via Back Biasing

Tsu-Jae King Liu, Alex Guo, Peter Matheu, 2011 .

SOI TFET $I_{\rm ON}/I_{\rm OFF}$ Enhancement via Back Biasing

A. Guo, P. Matheu, T. Liu, 2011, IEEE Transactions on Electron Devices.