Jason W. Li
发表
(Invited) Aspect Ratio Trapping: A Unique Technology for Integrating Ge and III-Vs with Silicon CMOS
A. Lochtefeld,
Ji‐Soo Park,
M. Curtin,
2010
.
M. Shishehbor,
P. Zavattieri,
D. Kisailus,
2020,
Nature Materials.
R. Proksch,
Jason W. Li,
J. Cleveland,
2009
.