J.C. Lee

发表

G. Bersuker, P. Kirsch, S. Oktyabrsky, 2009, 2009 IEEE International Electron Devices Meeting (IEDM).
J.C. Lee, G. Bersuker, B.H. Lee, 2007, 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
Jack C. Lee, K. Onishi, B. Lee, 2000, International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).
Tung-Sheng Chen, Shao-Hong Kuah, P. McIntyre, 1996, International Electron Devices Meeting. Technical Digest.
K. Zawadzki, J.C. Lee, R. Nieh, 1998, International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217).
J.C. Lee, Yongjoo Jeon, Wen-Jie Qi, 1999, International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318).
K. Onishi, L. Kang, J.C. Lee, 2000, IEEE Electron Device Letters.
K. Onishi, B. Lee, L. Kang, 2001, 2001 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.01 CH37184).
K. Onishi, R. Choi, H. Cho, 2001, International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).
K. Onishi, B. Lee, R. Choi, 2001, 2001 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.01 CH37184).
K. Onishi, R. Choi, J.C. Lee, 2001, Extended Abstracts of International Workshop on Gate Insulator. IWGI 2001 (IEEE Cat. No.01EX537).
K. Onishi, S. Krishnan, R. Choi, 2002, Digest. International Electron Devices Meeting,.
K. Onishi, S. Krishnan, R. Choi, 2002, Digest. International Electron Devices Meeting,.
K. Onishi, S. Krishnan, R. Choi, 2002, Digest. International Electron Devices Meeting,.
K. Onishi, S. Krishnan, R. Choi, 2002, 60th DRC. Conference Digest Device Research Conference.
K. Onishi, S. Krishnan, J.C. Lee, 2002, IEEE Electron Device Letters.
K. Onishi, R. Choi, J.C. Lee, 2001, International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).
J.C. Lee, Y.H. Kim, R. Choi, 2003, IEEE International Electron Devices Meeting 2003.
J.C. Lee, 2003, Extended Abstracts of International Workshop on Gate Insulator (IEEE Cat. No.03EX765).
G. Bersuker, K. Matthews, P. Kirsch, 2005, 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
J.C. Lee, R.E. Jones, J. Han, 1998, 1998 Symposium on VLSI Technology Digest of Technical Papers (Cat. No.98CH36216).
Bo Jiang, Jiyoung Kim, R. Khamankar, 1995, IEEE Electron Device Letters.
Jeong-Soo Lee, J.C. Lee, Jiyoung Kim, 1994, Proceedings of 1994 IEEE International Reliability Physics Symposium.
S. Krishnan, I. Ok, J.C. Lee, 2006, IEEE Electron Device Letters.
J.C. Lee, K. Onishi, S. Banerjee, 1999, International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318).
J.C. Lee, M.S. Akbar, J.C. Lee, 2004, IEEE Transactions on Electron Devices.
Yoon-Ha Jeong, Chang Yong Kang, J.C. Lee, 2008, IEEE Electron Device Letters.
B. Lee, N. Moumen, J. Barnett, 2005, 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
J.C. Lee, Bo Jiang, C. Sudhama, 1994, IEEE Electron Device Letters.
K. Onishi, C. Hu, H. Takeuchi, 2002, 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).
Manhong Zhang, S. Krishnan, C. Kang, 2006, IEEE Electron Device Letters.
Se Jong Rhee, J.C. Lee, Byoung Hun Lee, 2005, IEEE Electron Device Letters.
Jack C. Lee, K. Onishi, B. Lee, 2000, 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104).
K. Onishi, Y.H. Kim, J.C. Lee, 2003, IEEE Electron Device Letters.
J.C. Lee, S. Mudanai, R. Nieh, 2002, IEEE Electron Device Letters.
Chuan Lin, Jack C. Lee, J. Fulford, 1997, 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual.
Chang Yong Kang, Se Jong Rhee, Manhong Zhang, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
H. Hwang, R. Choi, J.C. Lee, 2005, 63rd Device Research Conference Digest, 2005. DRC '05..
Changhwan Choi, Chang Yong Kang, Se Jong Rhee, 2005, Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
J.C. Lee, K. Onishi, M.S. Akbar, 2003, IEEE Electron Device Letters.