J. Lee

发表

R. Jammy, P. Majhi, J. Lee, 2008, 2008 Symposium on VLSI Technology.

S. Koveshnikov, S. Datta, V. Tokranov, 2008, 2008 IEEE International Electron Devices Meeting.

B. Lee, L. Kang, J. Lee, 2000, 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059).

K. Onishi, B. Lee, L. Kang, 2000, 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104).

K. Onishi, S. Krishnan, R. Choi, 2002, 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).

Y.H. Kim, V. Misra, R. Choi, 2004, IEEE Electron Device Letters.

Y. Chen, J. Yum, H. Zhao, 2009, 2009 Device Research Conference.

Yoon-Ha Jeong, Chang Yong Kang, R. Jammy, 2012, Proceedings of Technical Program of 2012 VLSI Technology, System and Application.

K. Jeon, C. Kang, E. Jeong, 2011, IEEE Electron Device Letters.

F. Zhou, J. C. Lee, F. Zhou, 2015, 2015 International Symposium on VLSI Technology, Systems and Applications.

G. Bersuker, P. Kirsch, E. Yu, 2011, 2011 International Electron Devices Meeting.

Y. T. Chen, J. Woicik, D. Veksler, 2011, Proceedings of 2011 International Symposium on VLSI Technology, Systems and Applications.

G. Bersuker, E. Yu, J. Yum, 2011, IEEE Transactions on Electron Devices.

F. Zhou, Y. Chen, Y. Chen, 2011, IEEE Transactions on Electron Devices.

Wen-Jie Qi, T. Ngai, J. Fretwell, 2000 .

Yao-Feng Chang, Yinchang Zhao, Burt Fowler, 2017 .

G. Bersuker, D. Veksler, G. Verzellesi, 2012, IEEE Transactions on Electron Devices.

Yoon-Ha Jeong, Chang Yong Kang, Byoung Hun Lee, 2012, IEEE Electron Device Letters.

E. Yu, T. Tsai, F. Zhou, 2014, Proceedings of Technical Program - 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA).

Wen-Jie Qi, J.C. Lee, Byoung Hun Lee, 2000, International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).

Han Zhao, Yen‐Ting Chen, Yanzhen Wang, 2012, IEEE Electron Device Letters.

Han Zhao, Yen‐Ting Chen, F. Zhou, 2012, IEEE Electron Device Letters.