P. Boulenc
发表
N. Collaert,
N. Waldron,
B. Puers,
2020
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G. Faini,
V. Cros,
J. Grollier,
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C. van Hoof,
P. Boulenc,
A. Süss,
2021,
IEEE Electron Device Letters.
M. Rosmeulen,
C. Hoof,
Kasteelpark Arenberg,
2019
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C. Tavernier,
Y. Qiu,
D. Mangelinck,
2012,
2012 12th International Workshop on Junction Technology.
C. Tavernier,
J. Vaillant,
P. Boulenc,
2022
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Design and Characterization of a 3 . 5 um pitch , 8192 resolution , 5 Spectrum CMOS TDI image sensor
M. Rosmeulen,
J. Craninckx,
L. Haspeslagh,
2017
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P. Chevalier,
A. Chantre,
C. Gaquière,
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2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM).
A. Fert,
V. Cros,
J. Grollier,
2003,
cond-mat/0304312.
C. van Hoof,
P. Van Dorpe,
P. Boulenc,
2022,
IEEE Sensors Journal.
P. Boulenc,
I. Devos,
2006,
cond-mat/0607609.
C. Tavernier,
Y. Qiu,
A. Burenkov,
2012
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P. Boulenc,
I. Devos,
P. Boulenc,
2007,
Microelectron. Reliab..
O. Faynot,
F. Andrieu,
T. Skotnicki,
2011,
2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC).
M. Mao,
P. Heremans,
Yunlong Li,
2019
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A. Fert,
V. Cros,
J. Grollier,
2004
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P. De Moor,
L. Haspeslagh,
J. Borremans,
2017,
International Conference on Space Optics.
Francois Roy,
L. Pinzelli,
Maxime Gatefait,
2011
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