M. Meduňa

发表

Three dimensional heteroepitaxy: A new path for monolithically integrating mismatched materials with silicon

P. Niedermann, R. Kaufmann, A. Neels, 2012, CAS 2012 (International Semiconductor Conference).

Optical Characterization of Ultra-Thin Iron and Iron Oxide Films

M. Meduňa, P. Sťahel, L. Zajíčková, 2009 .

Intersubband absorption of strain-compensated Si1−xGex valence-band quantum wells with 0.7⩽x⩽0.85

T. Fromherz, D. Grützmacher, G. Bauer, 2005 .

Performance of Multilayer Monochromators for Hard X-Ray Imaging with Coherent Synchrotron Radiation

P. Cloetens, T. Weitkamp, A. Rack, 2011 .

Comparative study of multilayers used in monochromators for synchrotron-based coherent hard X-ray imaging.

P Cloetens, F Siewert, P. Cloetens, 2010, Journal of synchrotron radiation.

X-ray rocking curve imaging on large arrays of extremely tall SiGe microcrystals epitaxial on Si

H. Känel, H. von Känel, M. Meduňa, 2021 .

Strain relaxation in Ge microcrystals studied by high‐resolution X‐ray diffraction

H. von Känel, C. Falub, F. Isa, 2016 .

GaAs/Ge crystals grown on Si substrates patterned down to the micron scale

E. Müller, H. Känel, C. Falub, 2016 .

Tailoring the soft magnetic properties of sputtered multilayers by microstructure engineering for high frequency applications

C. Falub, M. Meduňa, M. Marioni, 2017 .

Structural studies of strain-symmetrised modulation-doped Si/SiGe structures grown by molecular beam epitaxy

T. Fromherz, E. Müller, D. Grützmacher, 2005 .

Growth temperature dependent strain in relaxed Ge microcrystals

H. Känel, H. von Känel, C. Falub, 2018, Thin Solid Films.

Lattice bending in three-dimensional Ge microcrystals studied by X-ray nanodiffraction and modelling

A. Dommann, C. Falub, F. Isa, 2016 .

The Radon transform as a tool for 3D reciprocal-space mapping of epitaxial microcrystals

H. von Känel, F. Isa, M. Meduňa, 2022, Journal of applied crystallography.

In situ investigations of Si and Ge interdiffusion in Ge-rich Si/SiGe multilayers using x-ray scattering

C. Falub, M. Meduňa, V. Holý, 2007 .

Micro-imaging performance of multilayers used as monochromators for coherent hard x-ray synchrotron radiation

A. Rack, F. Siewert, T. Holz, 2010, Optical Engineering + Applications.

Enhanced permeability dielectric FeCo/Al2O3multilayer thin films with tailored properties deposited by magnetron sputtering on silicon

S. Pietambaram, H. Hug, R. Hida, 2019, AIP Advances.

Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment

Michael Krumrey, Leonid Shabel'nikov, D. K. Bowen, 2008 .

Highly Mismatched, Dislocation‐Free SiGe/Si Heterostructures

P. Niedermann, R. Erni, H. von Känel, 2016, Advanced materials.

Structural and Ferromagnetic Properties of Sputtered FeCoB/AlN Soft Magnetic Multilayers for GHz Applications

R. Hida, H. Sibuet, C. Falub, 2017, IEEE Transactions on Magnetics.

Homogeneous and Heterogeneous Nucleation of Oxygen in Si-CZ

M. Meduňa, J. Kuběna, O. Caha, 2011 .

Investigation of morphology and chemical composition of self-organized semiconductor quantum dots and wires by X-ray scattering

M. Meduňa, G. Bauer, T. Roch, 2002 .

Reconstruction of crystal shapes by X-ray nanodiffraction from three-dimensional superlattices

H. Känel, C. Falub, T. Kreiliger, 2014 .

Studies of influence of high temperature preannealing on oxygen precipitation in CZ Si wafers

M. Meduňa, J. Buršík, O. Caha, 2012 .

Homogenization of CZ Si wafers by Tabula Rasa annealing

M. Meduňa, J. Kuběna, J. Buršík, 2009 .

Strain Engineering in Highly Mismatched SiGe/Si Heterostructures

P. Niedermann, H. Känel, R. Erni, 2017 .

Perfect crystals grown from imperfect interfaces

A. Dommann, H. von Känel, C. Falub, 2013, Scientific Reports.

Non-specular X-ray reflection from self-organized ripple structures in Si/Ge multilayers

O. Schmidt, M. Meduňa, T. Roch, 2002 .

Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies

G. Dehlinger, E. Müller, D. Grützmacher, 2002 .

X-ray diffraction on laterally modulated (InAs)n∕(AlAs)m short-period superlattices

M. Meduňa, A. Norman, J. Reno, 2004 .

Lateral composition modulation in (InAs) n /(AlAs) m short-period superlattices investigated by high-resolution x-ray scattering

M. Meduňa, A. Norman, J. Reno, 2002 .

X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with atomic force microscopy

G. Abstreiter, M. Meduňa, G. Bauer, 2001 .

3D heteroepitaxy of mismatched semiconductors on silicon

P. Niedermann, E. Müller, A. Neels, 2014 .

Innovative soft magnetic multilayers with enhanced in-plane anisotropy and ferromagnetic resonance frequency for integrated RF passive devices

R. Hida, C. Falub, M. Meduňa, 2018 .

Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals

F. Isa, G. Isella, M. Meduňa, 2018 .

X-ray diffraction on stacking faults in 3C-SiC epitaxial microcrystals grown on patterned Si(0 0 1) wafers

H. Känel, T. Kreiliger, M. Meduňa, 2019, Journal of Crystal Growth.

Annealing studies of high Ge composition Si/SiGe multilayers

O. Kermarrec, Y. Campidelli, D. Bensahel, 2004 .

Stacking Fault Analysis of Epitaxial 3C-SiC on Si(001) Ridges

I. Prieto, H. von Känel, T. Kreiliger, 2016 .

(Invited) Three-Dimensional Epitaxial Si1-XGex, Ge and SiC Crystals on Deeply Patterned Si Substrates

P. Niedermann, R. Kaufmann, A. Neels, 2014 .

Interdiffusion in Ge rich SiGe/Ge multilayers studied by in situ diffraction

G. Mussler, M. Meduňa, J. Stangl, 2009 .

Epitaxial Ge-crystal arrays for X-ray detection

P. Niedermann, R. Kaufmann, E. Müller, 2014 .

Elastic and Plastic Stress Relaxation in Highly Mismatched SiGe/Si Crystals

P. Niedermann, A. Neels, A. Dommann, 2016 .