M. Bina
发表
T. Grasser,
F. Schanovsky,
B. Kaczer,
2013,
2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
T. Grasser,
F. Schanovsky,
B. Kaczer,
2013,
Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
T. Grasser,
M. Waltl,
B. Kaczer,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
T. Grasser,
M. Bina,
S. Tyaginov,
2014
.
T. Grasser,
H. Reisinger,
B. Kaczer,
2015,
IEEE Transactions on Electron Devices.
Karl Rupp,
Tibor Grasser,
Jacopo Franco,
2014,
IEEE Transactions on Electron Devices.
L. Larcher,
A. Padovani,
A. Bertoni,
2021,
Physical Review Applied.
T. Grasser,
K. Rupp,
C. Jungemann,
2016,
Journal of computational electronics.
K. Rupp,
M. Bina,
2015
.
T. Grasser,
B. Kaczer,
J. Franco,
2013,
2013 IEEE International Integrated Reliability Workshop Final Report.
T. Grasser,
B. Kaczer,
J. Franco,
2014
.
T. Grasser,
K. Rupp,
C. Jungemann,
2016,
Journal of computational electronics.
Karl Rupp,
Tibor Grasser,
Prateek Sharma,
2015,
IEEE Transactions on Electron Devices.
T. Grasser,
B. Kaczer,
J. Franco,
2014,
2014 IEEE International Integrated Reliability Workshop Final Report (IIRW).
Tibor Grasser,
Jacopo Franco,
Ben Kaczer,
2014,
2014 IEEE International Reliability Physics Symposium.
A. Asenov,
B. Kaczer,
T. Grasser,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
C. Sandow,
A. Philippou,
M. Bina,
2016,
2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
T. Grasser,
H. Ceric,
Y. Wimmer,
2014,
2014 IEEE International Integrated Reliability Workshop Final Report (IIRW).
T. Grasser,
F. Schanovsky,
B. Kaczer,
2013
.