M. Karner

发表

H. Kosina, O. Baumgartner, M. Karner, 2008, 2008 International Conference on Simulation of Semiconductor Processes and Devices.

T. Grasser, W. Goes, V. Sverdlov, 2007, IEEE Transactions on Device and Materials Reliability.

S. Selberherr, T. Grasser, H. Kosina, 2007 .

T. Grasser, B. Kaczer, W. Goes, 2009, 2009 International Conference on Simulation of Semiconductor Processes and Devices.

R. Degraeve, B. Kaczer, D. Linten, 2015, 2015 IEEE International Electron Devices Meeting (IEDM).

G. Rzepa, C. Kernstock, O. Baumgartner, 2016, 2016 IEEE International Electron Devices Meeting (IEDM).

J. M. Park, I. Starkov, T. Grasser, 2012, 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

I. Starkov, T. Grasser, C. Jungemann, 2010, 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

F. Schanovsky, M. Karner, D. Verreck, 2019, 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).

T. Grasser, W. Goes, V. Sverdlov, 2007, IEEE Transactions on Device and Materials Reliability.

T. Grasser, W. Goes, V. Sverdlov, 2008, 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits.

S. Selberherr, T. Grasser, E. Langer, 2006, 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits.

T. Grasser, H. Kosina, M. Karner, 2007 .

E. Bertagnolli, M. Karner, C. Ostermaier, 2006 .

Tibor Grasser, Oliver Triebl, Hajdin Ceric, 2010, Microelectronics and reliability.

E. Seebacher, T. Grasser, H. Ceric, 2010, 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

Stefan Holzer, Siegfried Selberherr, Tibor Grasser, 2007, Microelectron. Reliab..

S. Selberherr, H. Kosina, E. Ungersboeck, 2006, 2006 International Conference on Simulation of Semiconductor Processes and Devices.

Hans Kosina, Andreas Gehring, Markus Karner, 2006, ECS Transactions.

H. Kosina, M. Pourfath, O. Baumgartner, 2007, 2007 International Semiconductor Device Research Symposium.

T. Grasser, H. Kosina, L. Filipovic, 2014, 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).

J. M. Gonzalez-Medina, M. Karner, Zhaozhao Hou, 2022, Solid-State Electronics.

L. Filipovic, O. Baumgartner, M. Karner, 2023, Micromachines.

Zlatan Stanojevic, Oskar Baumgartner, Markus Karner, 2013 .

B. Kaczer, T. Grasser, H. Reisinger, 2014, 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).

M. Rosmeulen, G. Rzepa, F. Schanovsky, 2021, 2021 IEEE International Electron Devices Meeting (IEDM).

Dimitri Linten, Geert Hellings, Jacopo Franco, 2021, 2021 IEEE International Reliability Physics Symposium (IRPS).

Markus Karner, Zlatan Stanojevic, Hans Kosina, 2013, 2013 IEEE International Electron Devices Meeting.

O. Baumgartner, M. Karner, C. Kernstock, 2016, 2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).

C. Kernstock, O. Baumgartner, E. Wimmer, 2015, 2015 IEEE International Electron Devices Meeting (IEDM).

C. Kernstock, Z. Stanojevic, O. Baumgartner, 2015, 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).

O. Baumgartner, M. Karner, Chen-Ming Tsai, 2021, IEEE Transactions on Electron Devices.

T. Grasser, M. Karner, M. Vasicek, 2008, 2008 International Conference on Simulation of Semiconductor Processes and Devices.

T. Grasser, M. Karner, M. Vasicek, 2008 .

T. Grasser, H. Kosina, E. Ungersboeck, 2007 .

K. Steiner, Markus Karner, Zoran Stanojevic, 2018, 2018 48th European Solid-State Device Research Conference (ESSDERC).