Chenyue Ma

发表

Modeling FinFETs for CMOS Applications

M. Chan, Lining Zhang, Jin He, 2013 .

A complete analytic surface potential-based core model for intrinsic nanowire surrounding-gate MOSFETs

M. Chan, Lining Zhang, Jin He, 2009 .

Logarithm cofactor difference extrema of MOS devices' post-breakdown current and application to parameter extraction

Xing Zhang, Chenyue Ma, F. He, 2010, 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology.

A methodology for short term and long term NBTI prediction under any bias conditions

Chenyue Ma, Xinnan Lin, Hanyu Zhang, 2017, 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Universal framework for temperature dependence prediction of the negative bias temperature instability based on microscope pictures

M. Chan, Lining Zhang, Chenyue Ma, 2016 .

CNN-inspired analytical global placement for large-scale heterogeneous FPGAs

Yao-Wen Chang, Jianli Chen, Chenyue Ma, 2022, Proceedings of the 59th ACM/IEEE Design Automation Conference.

A novel Negative Bias Temperature Instability model for nanoscale Finfet

Xing Zhang, Chenyue Ma, Xinnan Lin, 2009, 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

Development and Verification of Compact Model for NBTI (Negative Bias Temperature Instability) Effect Observed in p-MOSFET

Chenyue Ma, 2014 .

A Surface-Potential-Based Non-Charge-Sheet Core Model for SOI MOSFETs Valid to PD and FD Operation Modes

M. Chan, F. Liu, Jin He, 2008 .

Impact of interface-traps on TDDB lifetime by distorting the Weibull slope

Chenyue Ma, Xinnan Lin, Xuezhong Wu, 2017, 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

ON-state critical gate overdrive voltage for fluorine-implanted enhancement-mode AlGaN/GaN high electron mobility transistors

Li Yuan, Kevin J. Chen, Sen Huang, 2011 .

Numerical study on effects of random dopant fluctuation in double gate tunneling FET

Yu Cao, M. Chan, Jin He, 2013, 2013 IEEE International Conference of Electron Devices and Solid-state Circuits.

Accurate description of temperature accelerated NBTI effect using the universal prediction model

Chenyue Ma, Xinnan Lin, F. Sun, 2015, 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC).

Investigation of nitrogen enhanced NBTI effect using the universal prediction model

Peng Wu, Chenyue Ma, Lining Zhang, 2015, 2015 IEEE International Reliability Physics Symposium.

A physical based model to predict performance degradation of FinFET accounting for interface state distribution effect due to hot carrier injection

Xing Zhang, Chenyue Ma, Lining Zhang, 2011, Microelectron. Reliab..

A Physical Based Hot Carrier Injection Compact Model for Nanoscale FinFET

Lining Zhang, Xing Zhang, Jin He, 2009 .

A unified FinFET reliability model including high K gate stack dynamic threshold voltage, hot carrier injection, and negative bias temperature instability

Bo Li, Xing Zhang, Chenyue Ma, 2009, 2009 10th International Symposium on Quality Electronic Design.

An Accurate Method to Extract and Separate Interface and Gate Oxide Traps by the MOSFET Subthreshold Current

Wei Zhao, Jin He, W. Bian, 2011 .

Zero-Mask Contact Fuse for One-Time-Programmable Memory in Standard CMOS Processes

Mansun Chan, Chenyue Ma, Min Shi, 2011, IEEE Electron Device Letters.

Gate Underlap Design for Short Channel Effects Control in Cylindrical Gate-all-around MOSFETs based on an Analytical Model

Mansun Chan, Yun Ye, Qin Chen, 2012 .

Modeling of dynamic threshold voltage in high K gate stack and the application in FinFET reliability

Lining Zhang, Xing Zhang, Jin He, 2008, 2008 IEEE International Conference on Electron Devices and Solid-State Circuits.

Modeling of Dynamic Threshold Voltage of High K Gate Stack and Application in FinFET Reliability Simulation

Yu Cao, Jin He, Chenyue Ma, 2012 .

Compact Modeling of Dynamic Threshold Voltage of Nanoscale FinFET High K Gate Stack and Application in Circuit Simulation

Lining Zhang, Jin He, Chenyue Ma, 2009 .