D. Heller

Time-of-flight secondary ion mass spectrometry as a screening method for the identification of degradation products in lithium-ion batteries—A multivariate data analysis approach

D. Heller, B. Hagenhoff, C. Engelhard, 2016 .

Hidden information in principal component analysis of ToF‐SIMS data: On the use of correlation loadings for the identification of significant signals and structure elucidation

D. Heller, B. Hagenhoff, C. Engelhard, 2017 .

Surface characterization of nanoparticles: different surface analytical techniques compared

D. Heller, B. Hagenhoff, P. Brüner, 2013 .