J. Delétage

发表

Jean-Michel Vinassa, Olivier Briat, Philippe Gyan, 2016 .

J. Delétage, K. El boubkari, S. Azzopardi, 2012, 2012 13th International Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems.

E-H El Brouji, O. Briat, J. Vinassa, 2009, 2009 IEEE Energy Conversion Congress and Exposition.

A. Guedon-Gracia, H. Fremont, F. Verdier, 2009, EuroSimE 2009 - 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems.

Jean-Yves Delétage, Hélène Fremont, Frédéric Verdier, 2001 .

Jean-Yves Delétage, Alain Bensoussan, Eric Woirgard, 2018, Microelectronics and reliability.

S. Bila, D. Baillargeat, É. Cloutet, 2022, 2022 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP).

J. Delétage, F. Arabi, H. Frémont, 2018, 2018 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).

Jean-Yves Delétage, Claude Pellet, Céline Laville, 2001 .

Bernard Plano, Helene Fremont, Mickael Pocheron, 2015, IEEE Transactions on Device and Materials Reliability.

Jean-Yves Delétage, Alexandrine Guédon-Gracia, Hélène Frémont, 2018, Microelectron. Reliab..

J. Delétage, H. Frémont, A. Gracia, 2018, 2018 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).

L. Theolier, E. Woirgard, T. Youssef, 2017, 2017 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).

Jean-Yves Delétage, Eric Woirgard, Faical Arabi, 2016, Microelectron. Reliab..

Y. Danto, H. Fremont, M. Salagoity, 1998, Twenty Third IEEE/CPMT International Electronics Manufacturing Technology Symposium (Cat. No.98CH36205).

O. Briat, J. Y. Deletage, R. Chaari, 2011, Proceedings of the 2011 14th European Conference on Power Electronics and Applications.

O. Briat, G. Coquery, J. M. Vinassa, 2011, 2011 IEEE Vehicle Power and Propulsion Conference.

Jean-Michel Vinassa, Jean-Yves Delétage, Olivier Briat, 2017, IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society.

Jean-Yves Delétage, Yves Danto, Frédéric Verdier, 2003, Microelectron. Reliab..

J. Delétage, A. Guédon-Gracia, H. Frémont, 2021, Microelectronics Reliability.

J. Delétage, L. Béchou, Y. Ousten, 1996, Nineteenth IEEE/CPMT International Electronics Manufacturing Technology Symposium.

E. Woirgard, S. Azzopardi, F. Baccar, 2014, 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD).

J. Delétage, S. Azzopardi, E. Woirgard, 2013, 2013 15th European Conference on Power Electronics and Applications (EPE).

Jean-Yves Delétage, Hélène Frémont, J. B. Jullien, 2013, Microelectron. Reliab..

J. Delétage, B. Plano, A. Guédon-Gracia, 2021, Microelectronics Reliability.

Jean-Michel Vinassa, Olivier Briat, Cyril Martin, 2019, Microelectronics Reliability.

Jean-Yves Delétage, Alain Bensoussan, Eric Woirgard, 2018, 2018 IEEE International Reliability Physics Symposium (IRPS).

Frédéric Verdier, Yves Danto, J.-Y. Deltage, 2002, Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614).

A. Eddahech, O. Briat, J.-M. Vinassa, 2011, Microelectron. Reliab..

Jean-Michel Vinassa, Jean-Yves Delétage, Olivier Briat, 2016, Microelectron. Reliab..

Jean-Michel Vinassa, Jean-Yves Delétage, Olivier Briat, 2018, Microelectron. Reliab..

Jean-Michel Vinassa, Jean-Yves Delétage, Olivier Briat, 2018, 2018 IEEE International Conference on Industrial Technology (ICIT).

O. Briat, P. Gyan, I. Baghdadi, 2015, 2015 IEEE Vehicle Power and Propulsion Conference (VPPC).

Jean-Yves Delétage, A. Benmansour, Stephane Azzopardi, 2009, Microelectron. Reliab..

Jean-Yves Delétage, Hélène Fremont, S. Pin, 2018, International Conference on Thermal, Mechanial and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems.