K. Noguchi
发表
K. Noguchi,
C. Hu,
H. Shin,
1993,
IEEE Electron Device Letters.
Noriaki Oda,
K. Noguchi,
K. Noguchi,
2000,
2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059).
K. Sakai,
A. Fukuyama,
T. Ikari,
2008
.
Chenming Hu,
Hyungcheol Shin,
K. Noguchi,
1993,
31st Annual Proceedings Reliability Physics 1993.
T. Horiuchi,
K. Noguchi,
1996,
Proceedings of 1st International Symposium on Plasma Process-Induced Damage.
T. Horiuchi,
K. Noguchi,
1995,
IEEE 1995 International Integrated Reliability Workshop. Final Report.
C. Hu,
H. Shin,
K. Noguchi,
1993,
IEEE Electron Device Letters.
S. Samukawa,
K. Noguchi,
H. Ohtake,
2000
.
S. Samukawa,
K. Noguchi,
T. Mukai,
1999
.
K. Noguchi,
M. Sekine,
Y. Matsubara,
1994
.
K. Noguchi,
Y. Matsubara,
K. Okumura,
1993
.
M. V. Malyshev,
V. M. Donnelly,
J. Colonell,
2000
.