A. Stamper

发表

A. Chou, M. Khare, J. Gambino, 2001, 2001 6th International Symposium on Plasma- and Process-Induced Damage (IEEE Cat. No.01TH8538).
A. Stamper, T. McDevitt, S. Luce, 1998, IEEE/SEMI 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (Cat. No.98CH36168).
S. Cunningham, A. Morris, D. Dereus, 2011, 2011 16th International Solid-State Sensors, Actuators and Microsystems Conference.
S. Cunningham, A. Morris, A. Stamper, 2013, 2013 Transducers & Eurosensors XXVII: The 17th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS & EUROSENSORS XXVII).
A. Chou, T. Hook, A. Stamper, 2000, 2000 5th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.00TH8479).
V. McGahay, A. Stamper, P. Weigand, 1996, Proceedings of 1st International Symposium on Plasma Process-Induced Damage.
D. Stancil, T. Schlesinger, A. Stamper, 1988 .
Anthony K. Stamper, Richard A. Conti, Son Van Nguyen, 1999, IBM J. Res. Dev..
Robert Rosenberg, Anthony K. Stamper, Chao-Kun Hu, 2002 .
Robert Rosenberg, Anthony K. Stamper, Chao-Kun Hu, 2003 .
A. Stamper, J. Heidenreich, S. Luce, 1999, 1999 4th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.99TH8395).
A. Stamper, D. Armbrust, T.B. Hook, 1997, International Symposium on Plasma Process-Induced Damage.
R. Bolam, A. Stamper, T. Furukawa, 1993, 31st Annual Proceedings Reliability Physics 1993.
T. Standaert, J. Gambino, P. Biolsi, 2002, Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614).
E. Gebreselasie, M. Shinosky, S. Sankaran, 2008, 2008 IEEE International Reliability Physics Symposium.