Szu-Han Ho

发表

On the Origin of Hole Valence Band Injection on GIFBE in PD SOI n-MOSFETs

Osbert Cheng, Ann-Kuo Chu, Guangrui Xia, 2010, IEEE Electron Device Letters.

An investigation of total bacterial communities, culturable antibiotic-resistant bacterial communities and integrons in the river water environments of Taipei city.

Szu-Han Ho, Yi-Tang Chang, Chu-Wen Yang, 2014, Journal of hazardous materials.

Analysis of anomalous traps measured by charge pumping technique in HfO2/metal gate n-channel metal-oxide-semiconductor field-effect transistors

S. Sze, O. Cheng, Ting‐Chang Chang, 2012 .

Effects of fabrication method on defects induced by nitrogen diffusion to the hafnium oxide layer in metal-oxide-semiconductor field effect transistors

O. Cheng, Ting‐Chang Chang, T. Tseng, 2016 .

Anomalous Gate Current Hump after Dynamic Negative Bias Stress and Negative-Bias Temperature-Instability in p-MOSFETs with HfxZr1−xO2 and HfO2/Metal Gate Stacks

S. Sze, O. Cheng, Ting‐Chang Chang, 2013 .

Analysis of an anomalous hump in gate current after dynamic negative bias stress in HfxZr1-xO2/metal gate p-channel metal-oxide-semiconductor field-effect transistors

S. Sze, O. Cheng, Ting‐Chang Chang, 2012 .

High-k shallow traps observed by charge pumping with varying discharging times

O. Cheng, T. Tseng, Szu-Han Ho, 2013 .

Electron-electron scattering-induced channel hot electron injection in nanoscale n-channel metal-oxide-semiconductor field-effect-transistors with high-k/metal gate stacks

O. Cheng, Ching-Sen Lu, T. Tseng, 2014 .

Abnormal sub-threshold swing degradation under dynamic hot carrier stress in HfO2/TiN n-channel metal-oxide-semiconductor field-effect-transistors

O. Cheng, Szu-Han Ho, Wen-hung Lo, 2013 .