Bangbing Shi

Junction Temperature Measurement Method for SiC Bipolar Junction Transistor Using Base–Collector Voltage Drop at Low Current

Kun Bai, Chunsheng Guo, Bangbing Shi, 2019, IEEE Transactions on Power Electronics.

Junction Temperature Measurement Method for Power mosfets Using Turn-On Delay of Impulse Signal

Shiwei Feng, Yamin Zhang, Bangbing Shi, 2018, IEEE Transactions on Power Electronics.

Temperature distribution measurement based on field-programmable gate array embedded ring oscillators

Bangbing Shi, Shiwei Feng, Yamin Zhang, 2019, Solid-State Electronics.

Variation of Dominant Degradation Mechanism in AlGaN Barrier Layer With Different Voltage Stress on the Gate of AlGaN/GaN High Electron Mobility Transistors

Kun Liu, Bangbing Shi, Shiwei Feng, 2015, IEEE Electron Device Letters.

Improving thermal conductivity of radiators using a graphene-doped coating

Bangbing Shi, Shiwei Feng, Haoyang Yin, 2020, Surface Engineering.