T. Isaacs-Smith
发表
Leonard C. Feldman,
L. Tsetseris,
Robert A. Weller,
2006
.
R. Johnson,
M. Palmer,
M. Bozack,
1999
.
T. Isaacs-Smith,
Y. K. Sharma,
J. R. Williams,
2013,
IEEE Electron Device Letters.
Michael C. Hamilton,
Shiqiang Wang,
Minseo Park,
2018,
Microelectron. Reliab..
C. Tin,
John R. Williams,
T. Isaacs-Smith,
2013
.
John R. Williams,
T. Isaacs-Smith,
D. Nikles,
2005
.
J. Williams,
T. Isaacs-Smith,
E. Luckowski,
1997
.
D. Schroder,
M. Marinella,
M. Loboda,
2010,
IEEE Transactions on Electron Devices.
C. Tin,
T. Isaacs-Smith,
E. R. Crandall,
2012
.
J. Williams,
T. Isaacs-Smith,
A. Ahyi,
2010
.
S. Dhar,
L. Feldman,
J. Williams,
2005
.
S. Dhar,
L. Feldman,
G. Chung,
2003
.
D. Schroder,
M. Marinella,
M. Loboda,
2008,
2008 IEEE International Reliability Physics Symposium.
R. Loloee,
John R. Williams,
T. Isaacs-Smith,
2006
.
Xinmao Yin,
R. Paudel,
C. Tang,
2021,
Journal of physics. Condensed matter : an Institute of Physics journal.
M. Bozack,
S. Mohney,
J. Williams,
1998
.
S. Dhar,
G. Duscher,
Y. Sharma,
2014
.
J. Casady,
C. Tin,
J.R. Williams,
1996,
ICSE '96. 1996 IEEE International Conference on Semiconductor Electronics. Proceedings.
S. Mohney,
John R. Williams,
T. Isaacs-Smith,
2002
.
S. Saddow,
J. Casady,
J. Cooper,
2000
.
Q. Zhang,
H.-R. Chang,
M. Gomez,
2005,
Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005..