T. Hayashi

发表

H. Tanaka, T. Hayashi, Y. Shimoida, 2005, Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005..

Y. Sugawara, T. Hayashi, K. Asano, 2010, The 2010 International Power Electronics Conference - ECCE ASIA -.

Y. Sugawara, T. Hayashi, K. Asano, 2010, 2010 22nd International Symposium on Power Semiconductor Devices & IC's (ISPSD).

M. Miura-Mattausch, M. Kang, H. Mattausch, 2014, IEEE Transactions on Semiconductor Manufacturing.

M. Kang, H. Mattausch, M. Miura-Mattausch, 2013, 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS).

H. Mattausch, M. Miura-Mattausch, T. Hayashi, 2014, 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).

T. Hayashi, M. Uenohara, J. Copeland, 1967 .

S. Ogata, T. Izumi, K. Nakayama, 2012, 2012 24th International Symposium on Power Semiconductor Devices and ICs.

Y. Sugawara, Katsunori Asano, T. Hayashi, 2000, 12th International Symposium on Power Semiconductor Devices & ICs. Proceedings (Cat. No.00CH37094).

J. Temmyo, T. Hayashi, A. Hierro, 2009 .

Sei-Hyung Ryu, Y. Sugawara, D. Takayama, 2001, Proceedings of the 13th International Symposium on Power Semiconductor Devices & ICs. IPSD '01 (IEEE Cat. No.01CH37216).

T. Hayashi, H. Fukuda, T. Iwabuchi, 1992, 1992 International Technical Digest on Electron Devices Meeting.