G. E. Wabiszewski

Interrogation of single asperity electrical contacts using atomic force microscopy with application to nems logic switches

G. E. Wabiszewski, 2013 .

Next-Generation Nanoelectromechanical Switch Contact Materials: A Low-Power Mechanical Alternative to Fully Electronic Field-Effect Transistors.

F. Streller, G. E. Wabiszewski, R. Carpick, 2015, IEEE Nanotechnology Magazine.

Tunable, Source‐Controlled Formation of Platinum Silicides and Nanogaps from Thin Precursor Films

F. Streller, G. E. Wabiszewski, R. Carpick, 2014 .

Development and assessment of next-generation nanoelectromechanical switch contact materials

F. Streller, G. E. Wabiszewski, R. Carpick, 2014, 14th IEEE International Conference on Nanotechnology.

Novel materials solutions and simulations for nanoelectromechanical switches

A. Rappe, D. Srolovitz, F. Streller, 2015, 2015 IEEE 61st Holm Conference on Electrical Contacts (Holm).

Piezoelectric aluminum nitride nanoelectromechanical actuators

R. Mahameed, N. Sinha, G. Piazza, 2009 .

Characterization of Microscale Wear in a Polysilicon-Based MEMS Device Using AFM and PEEM–NEXAFS Spectromicroscopy

A. Corwin, M. P. Boer, A. Sumant, 2009 .

Angle-resolved environmental X-ray photoelectron spectroscopy: a new laboratory setup for photoemission studies at pressures up to 0.4 Torr.

F. Streller, G. E. Wabiszewski, P. Egberts, 2012, The Review of scientific instruments.

Ultra thin AlN piezoelectric nano-actuators

G. Piazza, R. Mahameed, N. Sinha, 2009, TRANSDUCERS 2009 - 2009 International Solid-State Sensors, Actuators and Microsystems Conference.

Characterizing nanoscale scanning probes using electron microscopy: A novel fixture and a practical guide.

G. E. Wabiszewski, T. Jacobs, R. Carpick, 2016, The Review of scientific instruments.