S. Ohkawa

Analysis and characterization of device variations in an LSI chip using an integrated device matrix array

H. Masuda, S. Ohkawa, M. Aoki, 2003, IEEE Transactions on Semiconductor Manufacturing.

Analysis and characterization of device variations in an LSI chip using an integrated device matrix array

S. Ohkawa, H. Masuda, M. Aoki, 2003, International Conference on Microelectronic Test Structures, 2003..