T. Meuse

HBM tester parasitic effects on high pin count devices with multiple power and ground pins

N. Peachey, M. Chaine, T. Meuse, 2006, 2006 Electrical Overstress/Electrostatic Discharge Symposium.

Progress towards a joint ESDA/JEDEC CDM standard: Methods, experiments, and results

T. Meuse, R. Ashton, J. Barth, 2012, Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012.

Formation and suppression of a newly discovered secondary EOS event in HBM test systems

C. Duvvury, J. Schichl, T. Meuse, 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium.

HBM ESD failures caused by a parasitic pre-discharge current spike

T. Meuse, J.W. Miller, H. Marom, 2008, EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium.

Developing a transient induced latch-up standard for testing integrated circuits

T. Meuse, L.G. Henry, J. Barth, 1999, Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396).

Voltages before and after HBM stress and their effect on dynamically triggered power supply clamps

T. Meuse, B.E. Weir, R.A. Ashton, 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium.

VF-TLP round robin study, analysis and results

N. Peachey, M. Chaine, T. Meuse, 2008, EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium.

Investigation into socketed CDM (SDM) tester parasitics

M. Chaine, T. Meuse, L.G. Henry, 1998, Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347).