L.G. Henry

HBM tester parasitic effects on high pin count devices with multiple power and ground pins

N. Peachey, M. Chaine, T. Meuse, 2006, 2006 Electrical Overstress/Electrostatic Discharge Symposium.

The real CDM field induced ESD waveform from MR heads

L.G. Henry, B.J. Hall, 1999, Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396).

Different CDM ESD Simulators provide different failure thresholds from the same device even though all the simulators meet the CDM standard specifications

L.G. Henry, E. Grund, R. Narayan, 2006, 2006 Electrical Overstress/Electrostatic Discharge Symposium.

Developing a transient induced latch-up standard for testing integrated circuits

T. Meuse, L.G. Henry, J. Barth, 1999, Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396).

TLP calibration, correlation, standards, and new techniques [ESD test]

L.G. Henry, J. Barth, K. Verhaege, 2000, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476).

Metrology and methodology of system level ESD testing

D. Smith, L.G. Henry, J. Barth, 1998, Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347).

Real HBM & MM – the dV/dt threat

L.G. Henry, J. Barth, M. Kelly, 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium.

Standardization of the transmission line pulse (TLP) methodology for electrostatic discharge (ESD)

M. Chaine, R. Ashton, L.G. Henry, 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium.

Considerations for an HBM ESD standard for measuring and testing of magneto resistive heads

A. Wallash, L.G. Henry, 2000, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476).

VF-TLP round robin study, analysis and results

N. Peachey, M. Chaine, T. Meuse, 2008, EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium.

Investigation into socketed CDM (SDM) tester parasitics

M. Chaine, T. Meuse, L.G. Henry, 1998, Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347).