L. Ting

HBM tester parasitic effects on high pin count devices with multiple power and ground pins

N. Peachey, M. Chaine, T. Meuse, 2006, 2006 Electrical Overstress/Electrostatic Discharge Symposium.

Formation and suppression of a newly discovered secondary EOS event in HBM test systems

C. Duvvury, J. Schichl, T. Meuse, 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium.

HBM stress of no-connect IC pins and subsequent arc-over events that lead to human-metal-discharge-like events into unstressed neighbor pins

C. Duvvury, S. Marum, J. Schichl, 2006, 2006 Electrical Overstress/Electrostatic Discharge Symposium.

Standardization of the transmission line pulse (TLP) methodology for electrostatic discharge (ESD)

M. Chaine, R. Ashton, L.G. Henry, 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium.

The effect of high pin-count ESD tester parasitics on transiently triggered ESD clamps

C. Duvvury, L. Ting, R. Steinhoff, 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium.

A new I/O signal latchup phenomenon in voltage tolerant ESD protection circuits

C. Duvvury, J. Schichl, L. Ting, 2003, 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual..