V. Gross

HBM tester parasitic effects on high pin count devices with multiple power and ground pins

N. Peachey, M. Chaine, T. Meuse, 2006, 2006 Electrical Overstress/Electrostatic Discharge Symposium.

Test-retest and inter-tester reliability of wideband reflectance in children

Ronald B. Gillam, Karen F. Muñoz, V. Gross, 2013 .

Study of gated pnp as an ESD protection device for mixed-voltage and hot-pluggable circuit applications

R. Gauthier, V. Gross, Minh Toug, 1996, 1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium.

CMOS-on-SOI ESD protection networks

J.Y.-C. Sun, V. Gross, S. Voldman, 1996, 1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium.