P. Dirksen

发表

Assessment of optical systems by means of point-spread functions

A. Janssen, J. Braat, S. V. Haver, 2008 .

Analytic expressions and approximations for the on-axis, aberration-free Rayleigh and Debye integral in the case of focusing fields on a circular aperture

A. Janssen, J. Braat, P. Dirksen, 2008 .

Strehl ratio and optimum focus of high-numerical-aperture beams

A. Janssen, J. Braat, S. V. Haver, 2007 .

Computing Zernike polynomials of arbitrary degree using the discrete Fourier transform

A. Janssen, P. Dirksen, 2007 .

Concise formula for the Zernike coefficients of scaled pupils

A. Janssen, P. Dirksen, 2006 .

On the computation of the nijboer-zernike aberration integrals at arbitrary defocus

A. Janssen, J. Braat, P. Dirksen, 2004 .

Extended Nijboer-Zernike representation of the vector field in the focal region of an aberrated high-aperture optical system.

A. Janssen, J. Braat, P. Dirksen, 2003, Journal of the Optical Society of America. A, Optics, image science, and vision.

Aberration retrieval from the intensity point-spread function in the focal region using the extended Nijboer–Zernike approach

J. J. M. Braat, A. J. E. M. Janssen, A. Janssen, 2005 .

Zernike representation and Strehl ratio of optical systems with variable numerical aperture

S. van Haver, A. Janssen, J. Braat, 2008 .

Energy and momentum flux in a high-numerical-aperture beam using the extended Nijboer-Zernike diffraction formalism

A. Janssen, J. Braat, S. V. Haver, 2007 .

Extended Nijboer-Zernike approach to aberration and birefringence retrieval in a high-numerical-aperture optical system.

Sven van Haver, Peter Dirksen, Joseph J M Braat, 2005, Journal of the Optical Society of America. A, Optics, image science, and vision.

Novel two-frequency laser

P. Dirksen, J. Werf, W. Bardoel, 1995 .

Impact of high-order aberrations on the performance of the aberration monitor

Peter De Bisschop, Andre Engelen, Henning Muellerke, 2000, Advanced Lithography.

Aberration retrieval using the extended Nijboer-Zernike approach

Joseph J. M. Braat, Augustus J. E. M. Janssen, Casper A. H. Juffermans, 2003 .

High-NA aberration retrieval with the Extended Nijboer-Zernike vector diffraction theory

Joseph J. M. Braat, Ajem Guido Janssen, Peter Dirksen, 2006 .

Assessment of an extended Nijboer-Zernike approach for the computation of optical point-spread functions.

Peter Dirksen, Augustus J E M Janssen, Joseph Braat, 2002, Journal of the Optical Society of America. A, Optics, image science, and vision.

Estimating resist parameters in optical lithography using the extended Nijboer-Zernike theory

Joseph J. M. Braat, Augustus J. E. M. Janssen, Peter Dirksen, 2006 .

Aerial image based lens metrology for wafer steppers

Joseph J. M. Braat, Tomoyuki Matsuyama, Augustus J. E. M. Janssen, 2006, SPIE Advanced Lithography.

Diffractive Read-Out of Optical Discs

Joseph J. M. Braat, Augustus J. E. M. Janssen, Peter Dirksen, 2003 .