J. Kuběna

发表

The effect of X-ray coherence on crystalline diffraction

J. Kuběna, 1968 .

X-ray diffraction on a three-dimensional lattice with account taken of the coherence of X-rays

J. Kuběna, 1968 .

X‐Ray Double and Triple Crystal Diffractometry of Silicon Crystals with Small Defects

J. Kuběna, V. Holý, 1992 .

On the integrated intensity of X-ray diffraction in crystals with randomly distributed defects

J. Kuběna, V. Holý, 1989 .

Characterization of Microdefects in Silicon by Means of X‐Ray Reflection Curves

J. Kuběna, V. Holý, 1989 .

Investigation of the growth striations in silicon by X-ray topography

J. Kuběna, V. Holý, 1983 .

Stacked Josephson junction based on Nb/Si superlattice

I. Vávra, J. Kuběna, V. Holý, 1997 .

A contribution to measuring the integrated intensities of diffraction lines by photographic methods

J. Kuběna, 1963 .

Development of oxide precipitates in silicon: calculation of the distribution function of the classical theory of nucleation by a nodal-points approximation

J. Kuběna, P. Mikulík, O. Caha, 2007 .

Spectroellipsometric characterisation of thin epitaxial Si1-xGex layers

M. Caymax, J. Kuběna, V. Holý, 1994 .

Spectroscopic ellipsometry of strained Si1-x Gex layers

M. Caymax, A. V. Ammel, J. Kuběna, 1993 .

A study of the nature of dislocation loops in growth striations in silicon by X‐Ray double crystal topography

J. Kuběna, V. Holý, K. T. Gabrielyan, 1986 .

Plane wave topography on crystals with step-like impurity distributions

J. Kuběna, J. Härtwig, U. Alter, 1985 .

X-Ray Reflection Curves of Si Crystals with Microdefects in the Laue Case

J. Kuběna, V. Holý, 1987 .

X‐ray double and triple crystal diffractometry of mosaic structure in heteroepitaxial layers

J. Kuběna, V. Holý, E. Abramof, 1993 .

Investigation of Quartz Crystals with Non-Homogeneous Distributions of Impurity Atoms by X-Ray Methods

J. Kuběna, V. Holý, J. Härtwig, 1988, January 16.

Temperature stability of C–N/NbN nanocomposite multilayers

J. Kuběna, V. Holý, G. Sorensen, 2000 .

Vacancies and Self-Interstitials Dynamics in Silicon Wafers

J. Kuběna, O. Caha, A. Kuběna, 2009 .

Analysis of vacancy and interstitial nucleation kinetics in Si wafers during rapid thermal annealing

J. Kuběna, O. Caha, A. Kuběna, 2009, Journal of physics. Condensed matter : an Institute of Physics journal.

Homogeneous and Heterogeneous Nucleation of Oxygen in Si-CZ

M. Meduňa, J. Kuběna, O. Caha, 2011 .

Study of Submicrocrystalline Materials by Diffuse Scattering in Transmitted Wave

J. Kuběna, V. Holý, D. Šimek, 2004 .

Homogenization of CZ Si wafers by Tabula Rasa annealing

M. Meduňa, J. Kuběna, J. Buršík, 2009 .

Laue case reflection curves of deformed crystals

J. Kuběna, V. Holý, Z. Janáček, 1981 .

Integrated Intensity of the Laue Diffraction from an Elastically Bent Crystal

J. Kuběna, Z. Janáček, 1978, January 16.

X-ray diffractometry of small defects in layered systems

J. Kuběna, V. Holý, E. Abramof, 1993 .

X-ray rocking curves on inhomogeneous surface layers on Si single crystals

J. Kuběna, V. Holý, 1982 .

X-ray diffuse scattering from defects in nitrogen-doped Czochralski grown silicon wafers

P. Klang, J. Kuběna, V. Holý, 2005 .