J. Kokorian

发表

Controlling adhesion between multi-asperity contacting surfaces in MEMS devices by local heating

W. V. Spengen, A. Gkouzou, J. Kokorian, 2016 .

In-Plane Displacement Detection With Picometer Accuracy on a Conventional Microscope

Federico Buja, J. Kokorian, F. Buja, 2015, Journal of Microelectromechanical Systems.

An ImageJ based measurement setup for automated phenotyping of plants

G. Polder, J. Keurentjes, D. Vreugdenhil, 2010 .

Improved analysis and visualization of friction loop data: unraveling the energy dissipation of meso-scale stick–slip motion

W. V. Spengen, J. Kokorian, W. M. van Spengen, 2017 .

Atomic scale adhesion phenomena in a two million cycle sidewall contact experiment

J. Kokorian, W. M. van Spengen, U. Staufer, 2015, 2015 Transducers - 2015 18th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS).

Observation of a carbon-based protective layer on the sidewalls of boron doped ultrananocrystalline diamond-based MEMS during in situ tribotests

W. V. Spengen, A. Sumant, J. Kokorian, 2015 .

Electrically conducting ultrananocrystalline diamond for the development of a next generation of micro-actuators

W. V. Spengen, A. Sumant, J. Kokorian, 2014 .

The initial run-in and long-term drift of the adhesive force between polycrystalline silicon MEMS sidewalls

J. Kokorian, W. M. van Spengen, 2021, Microsystem Technologies.

Studies on measuring surface adhesion between sidewalls in boron doped ultrananocrystalline diamond based microelectromechanical devices

W. V. Spengen, A. Sumant, J. Kokorian, 2015 .

Ultra-flat bismuth films for diamagnetic levitation by template-stripping

L. Abelmann, J. Kokorian, H. Nazeer, 2014 .

Observation of nanoscale adhesion, friction and wear between ALD Al2O3 coated silicon MEMS sidewalls

W. V. Spengen, J. Kokorian, F. Buja, 2015, Nanotechnology.

Fully compressible low-Mach number simulations of carbon-dioxide at supercritical pressures and trans-critical temperatures

W. V. Spengen, A. Gkouzou, J. Kokorian, 2017 .

An optical in-plane displacement measurement technique with sub-nanometer accuracy based on curve-fitting

J. Kokorian, F. Buja, W. M. van Spengen, 2014, 2014 IEEE 27th International Conference on Micro Electro Mechanical Systems (MEMS).

First adhesion measurements of conductive ultrananocrystalline diamond MEMS sidewalls

W. V. Spengen, A. Sumant, J. Kokorian, 2014, The 9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS).

Friction and dynamically dissipated energy dependence on temperature in polycrystalline silicon MEMS devices

A. Gkouzou, J. Kokorian, W. M. V. Spengen, 2017, Microsystem Technologies.