M. Texier

发表

Time-resolved piezoelectric response in relaxor ferroelectric (Pb0.88La0.12)(Zr0.52Ti0.48)O3 thin films

T. Cornelius, E. Araújo, M. Rössle, 2022, Journal of Applied Physics.

Silicide formation during reaction between Ni ultra-thin films and Si(0 0 1) substrates

N. Boudet, D. Mangelinck, O. Thomas, 2014 .

ZnO based nanowire network for gas sensing applications

M. Mouis, C. Zuliani, T. Cornelius, 2019, Materials Research Express.

Structural characterization of nc-Si films grown by low-energy PECVD on different substrates

S. Pizzini, G. Isella, A. L. Donne, 2008 .

Advances in Structural Characterization of Thin Film Nanocrystalline Silicon for Photovoltaic Applications

S. Pizzini, G. Isella, S. Binetti, 2007 .

Nanocrystalline silicon films as multifunctional material for optoelectronic and photovoltaic applications

L. Colombo, S. Sanguinetti, E. Grilli, 2006 .

Links Between Etching Grooves Of Partial Dislocations And Their Characteristics Determined By TEM In 4H SiC

M. Texier, G. Regula, M. Lancin, 2008 .

Atomic scale mechanisms and brittle to ductile transition at low size in silicon

J. Godet, M. Texier, L. Pizzagalli, 2018 .

Defects created in N-doped 4H-SiC in the brittle regime: Stacking fault multiplicity and dislocation cores

M. Texier, G. Regula, M. Lancin, 2009 .

Al–Pd–Mn icosahedral quasicrystal: deformation mechanisms in the brittle domain

J. Rabier, M. Texier, L. Thilly, 2007 .

Light-induced high-spin state in ZnO nanoparticles

O. Nur, M. Willander, M. Texier, 2019, Nanotechnology.

Optimum correction conditions for aberration-corrected HRTEM SiC dumbbells chemical imaging

M. Texier, J. Thibault-Pénisson, 2012 .

Ferroelectric nanodomains in epitaxial GeTe thin films

F. Leroy, T. Cornelius, O. Thomas, 2021, Physical Review Materials.

Nanoindentation-induced deformation in Al–Pd–Mn single quasicrystals

M. Texier, J. Bonneville, C. Coupeau, 2006 .

Te homogeneous precipitation in Ge dislocation loop vicinity

M. Texier, A. Portavoce, M. Bertoglio, 2016 .

Nanoporous Ge thin film production combining Ge sputtering and dopant implantation

M. Texier, L. Chow, M. Abbarchi, 2015, Beilstein journal of nanotechnology.

Low-temperature intrinsic plasticity in silicon at small scales

J. Rabier, A. Talneau, J. Godet, 2018, Acta Materialia.

Tungsten diffusion in silicon

C. Grosjean, M. Texier, A. Portavoce, 2014 .

Microstructure of I–Al–Pd–Mn deformed at low and intermediate temperatures

J. Rabier, M. Texier, A. Proult, 2004 .

On the plasticity of Al–Cu–Fe quasicrystals

M. Texier, A. Proult, J. Bonneville, 2005 .

On the yield point of icosahedral AlCuFe quasicrystals

J. Rabier, N. Baluc, M. Texier, 2003 .

LACBED study of extended defects in 4H-SiC

M. Texier, G. Regula, M. Lancin, 2006 .

Plastic behaviour and deformation mechanisms in silicon nano-objects

J. Rabier, A. Talneau, J. Godet, 2019, Journal of Physics: Conference Series.

TEM characterization of dislocations and slip systems in stishovite deformed at 14 GPa, 1,300°C in the multianvil apparatus

M. Texier, P. Cordier, 2006 .

Phase formation between Ni thin films and GaAs substrate

S. Zhiou, M. Texier, C. Perrin-Pellegrino, 2017 .

Continuous and Collective Grain Rotation in Nanoscale Thin Films during Silicidation.

O. Thomas, C. Mocuta, M. Texier, 2015, Physical review letters.

Structural disordering and extended defects produced by He-implantation in silicon carbide

M. Texier, M. Beaufort, J. Barbot, 2013 .

Piezoelectric response and electrical properties of Pb(Zr1-xTix)O3 thin films: The role of imprint and composition

A. Kholkin, T. Cornelius, E. Araújo, 2017 .

Mechanism of β-FeSi2 precipitates growth-and-dissolution and pyramidal defects' formation during oxidation of Fe-contaminated silicon wafers

C. Grosjean, M. Texier, A. Portavoce, 2015 .

Swelling and stacking fault formation in helium implanted SiC

M. Texier, M. Beaufort, J. Barbot, 2011 .

Microstructure of icosahedral Al-Pd-Mn quasicrystals deformed at room temperature in an anisotropic confining medium

J. Rabier, N. Baluc, M. Texier, 2002 .

Direct epitaxial growth of θ-Ni2Si by reaction of a thin Ni(10 at.% Pt) film with Si(1 0 0) substrate

D. Mangelinck, M. Texier, M. Juhel, 2014 .

First stages of Ni reaction with the Si(Ge) alloy

D. Mangelinck, G. Isella, M. Texier, 2017 .

Te implantation in Ge(001) for n-type doping applications

M. Texier, L. Chow, A. Portavoce, 2016 .

Twin boundary migration in an individual platinum nanocrystal during catalytic CO oxidation

S. Leake, J. Hofmann, Lu Gao, 2021, Nature Communications.

Dislocation distribution across ultrathin silicon-on-insulator with epitaxial SiGe stressor

M. Guzzi, E. Grilli, H. Känel, 2013 .

Microstructural analysis of i-AlPdMn quasi-crystals deformed between room temperature and 300 C under confining pressure

J. Rabier, N. Baluc, M. Texier, 2003 .

Hydrogenated Nanocrystalline Silicon Investigated by Conductive Atomic Force Microscopy

S. Pizzini, D. Chrastina, G. Isella, 2008 .

Structural Characterization of Nanocrystalline Silicon Layers Grown by LEPECVD for Optoelectronic Applications

S. Pizzini, D. Chrastina, G. Isella, 2007 .

Sample preparation by focused ion beam micromachining for transmission electron microscopy imaging in front-view.

M. Jublot, M. Texier, 2014, Micron.

Anomalous Glide Plane in Platinum Nano- and Microcrystals.

S. Leake, J. Hofmann, E. Rabkin, 2023, ACS nano.

Strain reorientation of hematite and its bearing upon remanent magnetization

H. Perroud, M. Texier, J. Cogné, 1986 .

Core Composition of Partial Dislocations in N-Doped 4H-SiC Determined by TEM Techniques, Dislocation Core Reconstruction and Image Contrast Analysis

M. Texier, G. Regula, M. Lancin, 2008 .

Dislocation Nucleation in Heteroepitaxial Semiconducting Films

M. Texier, V. Vdovin, B. Pichaud, 2009 .