T. Holgate
发表
B. Zhang,
Jian He,
T. Tritt,
2008
.
G. J. Snyder,
N. Pryds,
B. Balke,
2015
.
H. Kleinke,
Menghan Zhou,
Jian He,
2013
.
T. Holgate,
Tim Holgate,
2011
.
N. Pryds,
T. Holgate,
N. Nong,
2017,
Journal of Electronic Materials.
N. Pryds,
T. Holgate,
N. Nong,
2014
.
N. Pryds,
T. Holgate,
N. Nong,
2013,
Journal of Electronic Materials.
Qingjie Zhang,
S. Poon,
X. Su,
2010
.
N. Pryds,
T. Holgate,
L. Hung,
2013
.
Jian He,
T. Tritt,
Jiangying Peng,
2011
.
Terry M. Tritt,
Zhe Su,
Hong Xu,
2009
.
T. Caillat,
T. Holgate,
J. Ni,
2019,
Journal of Electronic Materials.
Jian He,
T. Tritt,
T. Holgate,
2013,
Journal of Electronic Materials.
T. Holgate,
J. Vanderveer,
T. Hammel,
2016,
2016 IEEE Aerospace Conference.
T. Holgate,
M. Hedenqvist,
E. Johansson,
2012,
ACS applied materials & interfaces.
Hong Xu,
H. Kleinke,
Jian He,
2009
.
N. Bonanos,
F. Lenrick,
T. Holgate,
2013,
Journal of Materials Science.
N. Pryds,
Wei Zhang,
T. Holgate,
2014
.
D. Thompson,
W. Xie,
Yonggao Y. Yan,
2011
.
U. Gedde,
T. Holgate,
M. Hedenqvist,
2014
.
Russell Bennett,
Bob Sievers,
Thierry Caillat,
2015,
Journal of Electronic Materials.
Jian He,
T. Tritt,
Z. Su,
2009
.
Qingjie Zhang,
Shanyu Wang,
W. Xie,
2011
.
J. Fleurial,
T. Caillat,
T. Holgate,
2016
.
N. Pryds,
B. Iversen,
E. Bøjesen,
2014
.
N. Pryds,
M. Søndergaard,
B. Iversen,
2013,
Journal of Electronic Materials.
Effects of conducting oxide barrier layers on the stability of Crofer® 22 APU/Ca_3Co_4O_9 interfaces
N. Pryds,
T. Holgate,
N. Nong,
2014
.
G. Botton,
Hong Xu,
H. Kleinke,
2010
.
D. Thompson,
S. Gorsse,
H. Kleinke,
2013
.