E. Soergel

发表

Karsten Buse, Lærke Bang Jacobsen, Dirk Apitz, 2005, Applied optics.

E. Soergel, F. Johann, 2009, 1009.1902.

E. Soergel, Á. Hoffmann, T. Jungk, 2006, The Review of scientific instruments.

Simon J. Herr, B. Sturman, K. Buse, 2017, 1703.02612.

E. Soergel, Kelly Banyas, Nevenka Zdravkovska, 2017 .

E. Soergel, Á. Hoffmann, T. Jungk, 2006, The Review of scientific instruments.

E. Soergel, F. Johann, 'A. Hoffmann, 2010, 1009.1905.

E. Soergel, Á. Hoffmann, T. Jungk, 2007, cond-mat/0703793.

M. Fiebig, E. Soergel, Á. Hoffmann, 2013, The Review of scientific instruments.

B. Messerschmidt, S. Reichel, R. Brunner, 2007 .

Ingo Breunig, Karsten Buse, Simon J. Herr, 2017, Scientific Reports.

E. Soergel, G. Zisis, S. Mailis, 2013, 2013 Conference on Lasers & Electro-Optics Europe & International Quantum Electronics Conference CLEO EUROPE/IQEC.

B. Sturman, K. Buse, R. Eason, 2011, 2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference (CLEO EUROPE/EQEC).

R. Eason, C. Sones, E. Soergel, 2011, 2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference (CLEO EUROPE/EQEC).

R. Eason, C. Sones, E. Soergel, 2011, CLEO: 2011 - Laser Science to Photonic Applications.

M. Fiebig, E. Soergel, T. Jungk, 2010, 1101.3565.

E. Soergel, Á. Hoffmann, T. Jungk, 2006, cond-mat/0602414.

A. Boes, A. Mitchell, E. Soergel, 2015, 2015 Joint IEEE International Symposium on the Applications of Ferroelectric (ISAF), International Symposium on Integrated Functionalities (ISIF), and Piezoelectric Force Microscopy Workshop (PFM).

A. Boes, E. Soergel, V. Sivan, 2013, CLEO: 2013.

Martin M. Fejer, Karsten Buse, Carsten Langrock, 2005 .

A. Boes, A. Mitchell, J. Friend, 2013, 2013 Joint IEEE International Symposium on Applications of Ferroelectric and Workshop on Piezoresponse Force Microscopy (ISAF/PFM).

A. Boes, A. Mitchell, J. Friend, 2013, 2013 Joint IEEE International Symposium on Applications of Ferroelectric and Workshop on Piezoresponse Force Microscopy (ISAF/PFM).

R. Eason, C. Sones, E. Soergel, 2009, 0905.2209.