G. Soelkner

Optical beam testing and its potential for electronic device characterization

G. Soelkner, Gerald Soelkner, 1993 .

Reliability of SiC Power Devices Against Cosmic Radiation-Induced Failure

M. Treu, D. Peters, G. Soelkner, 2007 .

Charge carrier avalanche multiplication in high-voltage diodes triggered by ionizing radiation

Gerhard Wachutka, K. H. Maier, W. Kaindl, 2000 .

Cosmic radiation-induced failure mechanism of high voltage IGBT

G. Wachutka, W. Kaindl, G. Wachutka, 2005, Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005..

Reliability of power electronic devices against cosmic radiation-induced failure

Gerald Soelkner, Winfried Kaindl, H.-J. Schulze, 2004, Microelectron. Reliab..

Influence of dynamic switching on the robustness of power devices against cosmic radiation

F. Pfirsch, T. Duetemeyer, W. Brekel, 2012, 2012 24th International Symposium on Power Semiconductor Devices and ICs.

Experimental and theoretical laser-Doppler frequency spectra of a tissuelike model of a human head with capillaries.

G. Soelkner, R. Lohwasser, G Soelkner, 1999, Applied optics.