J. Peden

Design and characterization of ionizing radiation-tolerant CMOS APS image sensors up to 30 Mrd (Si) total dose

E. Eid, T. Y. Chan, E. R. Fossurn, 2001 .

Heavy ion transient characterization of a hardened-by-design active pixel sensor array

Kenneth A. LaBel, Paul W. Marshall, Cheryl J. Marshall, 2002, IEEE Radiation Effects Data Workshop.

Theoretical and experimental studies of semiconductor device degradation due to high power electrical transients. Final technical report, 6 March 1972--31 December 1973

J. L. Andrews, Dante M. Tasca, Joseph C. Peden, 1973 .