D. Cornale

发表

Enhancement of Transistor-to-Transistor Variability Due to Total Dose Effects in 65-nm MOSFETs

S. Gerardin, M. Bagatin, A. Paccagnella, 2015, IEEE Transactions on Nuclear Science.

Radiation-Induced Short Channel (RISCE) and Narrow Channel (RINCE) Effects in 65 and 130 nm MOSFETs

S. Gerardin, A. Paccagnella, D. Cornale, 2015, IEEE Transactions on Nuclear Science.