P. Tangyunyong

发表

Issues for single-event proton testing of SRAMs

E. Blackmore, J. Baggio, J.A. Felix, 2004, IEEE Transactions on Nuclear Science.

Method for the study of semiconductor device operation using scanning capacitance microscopy

M. Shaneyfelt, P. Tangyunyong, C. Nakakura, 2003 .

Identification of radiation-induced parasitic leakage paths using light emission microscopy

T. A. Hill, G. L. Hash, P. Dodd, 2003, Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003..

Backside localization of open and shorted IC interconnections

P. Tangyunyong, D. Barton, E. I. Cole, 1998, 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173).

TIVA and SEI Developments for Enhanced Front and Backside Interconnection Failure Analysis

D. Benson, P. Tangyunyong, D. Barton, 1999 .

Resistive interconnection localization

Rosalinda M. Ring, C. Hawkins, P. Tangyunyong, 2002, Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614).

Fluorescent microthermal imaging—theory and methodology for achieving high thermal resolution images

Paiboon Tangyunyong, D. L. Barton, P. Tangyunyong, 1995 .

Characterization of electrically-active defects in ultraviolet light-emitting diodes with laser-based failure analysis techniques

P. Tangyunyong, E. I. Cole, M.A. Miller, 2016 .

Infrared light emission from semiconductor devices

F. J. Low, D. L. Barton, J. M. Soden, 1996 .

Focused Ion Beam Induced Effects on MOS Transistor Parameters

S. E. Swanson, D. Fleetwood, N. Antoniou, 1999 .

Bonding, structure and compositional distribution in sheet crystal silver iodobromide (111)

T. Rhodin, P. Tangyunyong, Yen T. Tan, 1993 .

Anharmonic corrections in EXAFS from AgBr

T. Rhodin, D. Batchelor, P. Tangyunyong, 1995 .

SEXAFS study of AgBr(111) and (100) surfaces and comparison to theoretical models

T. Rhodin, P. Tangyunyong, Yen T. Tan, 1991 .

Frequency dependence of the lifetime of a surface micromachined microengine driving a load

D. M. Tanner, Kenneth A. Peterson, Paiboon Tangyunyong, 1999 .

Product development and yield enhancement through failure analysis of integrated circuits with scanning capacitance microscopy

P. Tangyunyong, C. Nakakura, 2003 .

Failure analysis for micro-electrical-mechanical systems (MEMS)

Kenneth A. Peterson, Paiboon Tangyunyong, Daniel L. Barton, 1997 .

The effect of frequency on the lifetime of a surface micromachined microengine driving a load

D. M. Tanner, Kenneth A. Peterson, Paiboon Tangyunyong, 1998, 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173).