D. Lewis
发表
Pierre Magnan,
D. Lewis,
V. Pouget,
2002
.
Dean Lewis,
Pascal Fouillat,
Vincent Pouget,
2004
.
Hervé Lapuyade,
D. Lewis,
Philippe Perdu,
2001
.
E. Lorfèvre,
R. Ecoffet,
V. Pouget,
2011,
IEEE Transactions on Nuclear Science.
J. Dutertre,
F. Roche,
D. Lewis,
2001,
RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605).
P. Perdu,
V. Pouget,
D. Lewis,
2005,
Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005..
P. Perdu,
V. Pouget,
D. Lewis,
2005,
IEEE Transactions on Nuclear Science.
M. Bafleur,
P. Perdu,
V. Pouget,
2006,
IEEE Transactions on Device and Materials Reliability.
P. Perdu,
V. Pouget,
D. Lewis,
2013,
2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
P. Perdu,
D. Lewis,
T. Beauchêne,
2002,
Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614).
Romain Desplats,
Philippe Perdu,
Dean Lewis,
2003,
Microelectron. Reliab..
P. Perdu,
D. Lewis,
T. Beauchêne,
2003,
Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003.
Philippe Perdu,
Dean Lewis,
Felix Beaudoin,
2003,
Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003.
Philippe Perdu,
Dean Lewis,
Felix Beaudoin,
2000
.
Philippe Perdu,
Dean Lewis,
Nicolas Guitard,
2007
.
Romain Desplats,
Philippe Perdu,
Dean Lewis,
2002,
Microelectron. Reliab..
P. Perdu,
D. Lewis,
G. Bascoul,
2011,
18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
O. Musseau,
S. Buchner,
A. Campbell,
2002
.
O. Musseau,
S. Buchner,
A. Campbell,
2001,
RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605).
P. Mounaix,
D. Lewis,
Jean-Paul Guillet,
2017,
2017 42nd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz).
P. Perdu,
D. Lewis,
K. Sanchez,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
P. Perdu,
D. Lewis,
F. Beaudoin,
2003
.
Romain Desplats,
Philippe Perdu,
Dean Lewis,
2002,
Microelectron. Reliab..
V. Pouget,
D. Lewis,
E. Faraud,
2011,
18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Investigation on the Single Event Burnout Sensitive Volume Using Two-Photon Absorption Laser Testing
E. Lorfèvre,
V. Pouget,
D. Lewis,
2012,
IEEE Transactions on Nuclear Science.
Philippe Perdu,
Kevin Sanchez,
Olivier Crepel,
2007
.
Dean Lewis,
Stefan Dilhaire,
Wilfrid Claeys,
1997
.
S. Gold,
D. Lewis,
A. Fliflet,
2006
.
S. Gold,
D. Lewis,
A. Fliflet,
2006
.
C. Boit,
V. Pouget,
D. Lewis,
2008
.
D. Lewis,
Luca Silvestri,
Maxime Penzes,
2017,
Microelectron. Reliab..
V. Pouget,
D. Lewis,
E. Faraud,
2011,
Optics express.
Y. Ousten,
D. Lewis,
V. Pouget,
2005,
IEEE Transactions on Device and Materials Reliability.
Hervé Lapuyade,
Dean Lewis,
Pascal Fouillat,
2001,
Microelectron. Reliab..
Philippe Perdu,
Dean Lewis,
Vincent Pouget,
2013,
IEEE Transactions on Nuclear Science.
V. Pouget,
F. Darracq,
D. Lewis,
2013,
Microelectron. Reliab..
V. Quintard,
S. Dilhaire,
W. Claeys,
1993
.
D. Lewis,
J. Chromczak,
D. Lewis,
2012,
2012 International Electron Devices Meeting.
Hervé Lapuyade,
Dean Lewis,
Pascal Fouillat,
1999
.
Dean Lewis,
Stefan Dilhaire,
Wilfrid Claeys,
1997
.
V. Pouget,
D. Lewis,
P. Fouillat,
2007
.
V. Quintard,
S. Dilhaire,
W. Claeys,
1998
.
Dean Lewis,
Pascal Fouillat,
Vincent Pouget,
2007
.