Durga Misra

Screening of hot electron effect during plasma processing

Purushothaman Srinivasan, B. Vootukuru, Durga Misra, 2004, 17th International Conference on VLSI Design. Proceedings..

VLSI design of stability routing protocol for sensors in MANETs

L. Zakrevski, Durga Misra, Vishnu Mandava, 2003, International Conference on Information Technology: Research and Education, 2003. Proceedings. ITRE2003..

Integrated optoelectronics : proceedings of the first international symposium

Jerzy Ruzyllo, Durga Misra, M. Jamal Deen, 2002 .

Reliability of HfAlOx in multi layered gate stack

Durga Misra, M. Nasir Bhuyian, D. Misra, 2015, 2015 IEEE International Reliability Physics Symposium.

Degradation of NMOSFETs during high-field injection with reverse biased voltage at source and drain junctions

Durga Misra, R. K. Jarwal, 2001, VLSI Design 2001. Fourteenth International Conference on VLSI Design.

Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks

Cor Claeys, Eddy Simoen, Paolo Magnone, 2007, Microelectron. Reliab..

A Synthesizable VHDL Model of the Exact Solution for Three-dimensional Hyperbolic Positioning System

Durga Misra, Ralph Bucher, D. Misra, 2002, VLSI Design.

Interfaces in electronic materials : proceedings of the international symposium

W. Wong-Ng, Durga Misra, O. Leonte, 2006 .

Temperature dependent time-to-breakdown (TBD) of TiN/HfO2 n-channel MOS devices in inversion

X. Wang, Gennadi Bersuker, Durga Misra, 2009, Microelectron. Reliab..

Voltage and current stress induced variations in TiN/HfSixOy/TiN MIM capacitors

Durga Misra, Arun N. Chandorkar, Jyothi Kasinath, 2013, Microelectron. Reliab..

Ambient temperature and layout impact on self-heating characterization in FinFET devices

A. Kerber, Durga Misra, D. Singh, 2018, 2018 IEEE International Reliability Physics Symposium (IRPS).