J. M. Mirabel

EEPROM programming study-time and degradation aspects

Rachid Bouchakour, Pierre Canet, Nadia Harabech, 2001, ISCAS 2001. The 2001 IEEE International Symposium on Circuits and Systems (Cat. No.01CH37196).

Modeling of a floating-gate EEPROM cell using a charge sheet approach including variable tunneling capacitance and polysilicon gate depletion effect

Rachid Bouchakour, Pierre Canet, Nadia Harabech, 2001, ISCAS 2001. The 2001 IEEE International Symposium on Circuits and Systems (Cat. No.01CH37196).

Decreasing EEPROM programming bias with negative voltage, reliability impact

Romain Laffont, Rachid Bouchakour, Pierre Canet, 2002, Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002).