Yasunobu Saito

Field-Plate Structure Dependence of Current Collapse Phenomena in High-Voltage GaN-HEMTs

Wataru Saito, Tomohiro Nitta, Masakazu Yamaguchi, 2010, IEEE Electron Device Letters.

Normally‐off GaN‐MISFET with well‐controlled threshold voltage

W. Saito, I. Omura, M. Kuraguchi, 2007 .

Solvent effect on thermal degradation of polystyrene

Yasunobu Saito, Tadahiro Murakata, S. Sato, 1990 .

Effect of solvent on thermal degradation of poly(p-methylstyrene)

Yasunobu Saito, Tadahiro Murakata, S. Sato, 1993 .

Evaluation methodology for current collapse phenomenon of GaN HEMTs

Takeshi Hamamoto, Takuo Kikuchi, Tatsuya Ohguro, 2018, 2018 IEEE International Reliability Physics Symposium (IRPS).

Suppression of Dynamic On-Resistance Increase and Gate Charge Measurements in High-Voltage GaN-HEMTs With Optimized Field-Plate Structure

W. Saito, I. Omura, Y. Saito, 2007, IEEE Transactions on Electron Devices.

Solvent effect on thermal degradation of polystyrene and poly-α-methylstyrene

Yasunobu Saito, Tadahiro Murakata, S. Sato, 1993 .