Nobuaki Otsuka
发表
Atsushi Kawasumi,
Osamu Hirabayashi,
Yasuhisa Takeyama,
2008,
2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers.
Atsushi Kawasumi,
Osamu Hirabayashi,
Yasuhisa Takeyama,
2002,
Proceedings. International Test Conference.
Makoto Arai,
Hiroyuki Kobayashi,
Nobuyuki Itoh,
2010,
IEICE Trans. Electron..
T. Kobayashi,
Atsushi Kawasumi,
Osamu Hirabayashi,
1998,
1998 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.98CH36215).
Atsushi Suzuki,
Shinji Miyano,
Hiroyuki Takenaka,
2008,
2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers.
Direct Cell-Stability Test Techniques for an SRAM Macro with Asymmetric Cell-Bias-Voltage Modulation
Osamu Hirabayashi,
Yasuhisa Takeyama,
Keiichi Kushida,
2008,
2008 IEEE International Test Conference.
Katsumi Hisano,
Takahiko Sasaki,
Nobuaki Otsuka,
2005
.
Osamu Hirabayashi,
Yasuhisa Takeyama,
Keiichi Kushida,
2005,
2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05).
Atsushi Suzuki,
Shinji Miyano,
Nobuaki Otsuka,
2008,
2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers.