J. Gertas

Reliability of Ferroelectric Random Access memory embedded within 130nm CMOS

J. Rodriguez, K. Remack, J. Gertas, 2010, 2010 IEEE International Reliability Physics Symposium.

Reliability Demonstration of a Ferroelectric Random Access Memory Embedded within a 130nm CMOS Process

J. Rodriguez, K. Remack, J. Gertas, 2007, 2007 Non-Volatile Memory Technology Symposium.

High-Density 8Mb 1T-1C Ferroelectric Random Access Memory Embedded Within a Low-Power 130nm Logic Process

J. Rodriguez, K. Remack, J. Gertas, 2007, 2007 Sixteenth IEEE International Symposium on the Applications of Ferroelectrics.

Reliability characterization of a Ferroelectric Random Access Memory embedded within 130nm CMOS

J. Gertas, K. Boku, D. Kim, 2008, 2008 17th IEEE International Symposium on the Applications of Ferroelectrics.

Full-Bit Functional, High-Density 8 Mbit One Transistor–One Capacitor Ferroelectric Random Access Memory Embedded within a Low-Power 130 nm Logic Process

K. Remack, J. Gertas, K. Boku, 2007 .