W. Shih
发表
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P. Packan,
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Digest. International Electron Devices Meeting,.
Thomas J. T. Kwan,
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Christine M. Maziar,
1995,
Proceedings of International Electron Devices Meeting.
Predictive compact modeling of NQS effects and thermal noise in 90nm mixed-signal/RF CMOS technology
S. Mudanai,
Wei-Kai Shih,
P. Packan,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
Haihong Wang,
A. F. Tasch,
Wei-Kai Shih,
1998,
VLSI Design.
A. Tasch,
E. Wang,
F. Leon,
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Yiyu Shi,
Cheng Zhuo,
Kassan Unda,
2019,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
S. Mudanai,
Wei-Kai Shih,
P. Packan,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
K. Mistry,
Wei-Kai Shih,
P. Packan,
2001,
International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).