X. Xi

Analytical Modeling of Output Conductance in Long-Channel Halo-Doped MOSFETs

Xuemei Xi, S. Mudanai, Wei-Kai Shih, 2006, IEEE Transactions on Electron Devices.

Compact Modeling for RF and Microwave Integrated Circuits

C. Hu, Yu Cao, A. Niknejad, 2003 .

Linearly graded doping drift region: A novel lateral voltage-sustaining layer used for improvement of RESURF LDMOS transistor performances

C. Hu, M. Chan, Ru Huang, 2002 .

BSIM5 MOSFET Model

Mansun Chan, Jin He, Chenming Hu, 2004, Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004..

Modeling Advanced FET Technology in a Compact Model

Chenming Hu, Chung-Hsun Lin, Xuemei Xi, 2006, IEEE Transactions on Electron Devices.

A scaleable model for STI mechanical stress effect on layout dependence of MOS electrical characteristics

Xuemei Xi, Chung-Kai Lin, Ke-Wei Su, 2003, Proceedings of the IEEE 2003 Custom Integrated Circuits Conference, 2003..

Challenges in Compact Modeling for RF and Microwave Applications

Ali M. Niknejad, Jin He, Sohrab Emami, 2005 .