S. O’Shea
发表
C. Sow,
L. Lui,
Ke Li,
2008
.
Chorng Haur Sow,
C. Sow,
L. Lui,
2006
.
K. Pey,
N. Raghavan,
S. O’Shea,
2020
.
K. Pey,
N. Raghavan,
M. Bosman,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
S. O’Shea,
X. Su,
Jian Zhang,
2002
.
Mark A. Lantz,
Mark E. Welland,
K. Johnson,
1997
.
K. Pey,
A. Wee,
C. Troadec,
2007
.
H. Chong,
J. McBride,
S. O’Shea,
2017
.
Jian Zhang,
S. O’Shea,
Jian Zhang,
2003
.
Chin-Yo Lin,
Xiaodi Su,
J. Thomsen,
2006,
Analytical chemistry.
H. Ng,
S. O’Shea,
X. Su,
2000,
The Analyst.
K. Ansari,
S. O’Shea,
W. Hofbauer,
2011,
The Review of scientific instruments.
M. Lantz,
S. O’Shea,
H. Tokumoto,
1999
.
K. Pey,
S. O’Shea,
Shubhakar Kalya,
2017
.
L. Larcher,
A. Padovani,
F. Puglisi,
2016
.
S. O’Shea,
X. Su,
2001,
Analytical biochemistry.
K.H. Lee,
P. Lu,
T. Ng,
2002,
Proceedings of IEEE Sensors.
Xiaosong Tang,
Raymond R Dagastine,
Derek Y C Chan,
2010,
Proceedings of the National Academy of Sciences.
S. Sinha,
S. O’Shea,
X. S. Tang,
2013,
The Review of scientific instruments.
K. H. Lau,
S. O’Shea,
N. Yakovlev,
2006,
Langmuir : the ACS journal of surfaces and colloids.
Xiaoping Zhou,
Sam F. Y. Li,
S. O’Shea,
2000
.
B. Khoo,
E. Klaseboer,
C. Ohl,
2012,
Physical review. E, Statistical, nonlinear, and soft matter physics.
K. Novoselov,
Kenji Watanabe,
T. Taniguchi,
2021,
ACS Applied Electronic Materials.
L. Larcher,
A. Padovani,
F. Puglisi,
2018
.
H. Iwai,
K. Pey,
K. Kakushima,
2008
.
L. Larcher,
A. Padovani,
F. Puglisi,
2019,
IEEE Electron Device Letters.
F. Puglisi,
P. Pavan,
K. Pey,
2022,
ACS Applied Electronic Materials.
H. Iwai,
K. Pey,
K. Kakushima,
2009,
2009 IEEE International Reliability Physics Symposium.
Sam F. Y. Li,
S. O’Shea,
Y. Xing,
2003
.
S. O’Shea,
W. Hofbauer,
N. Gosvami,
2010
.
H. Iwai,
K. Pey,
K. Kakushima,
2010,
2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
K. Pey,
A. Wee,
C. Troadec,
2007
.
H. Gong,
S. O’Shea,
R. Akkipeddi,
2006
.
K. Pey,
N. Raghavan,
S. O’Shea,
2022,
Scientific Reports.
L. Larcher,
A. Padovani,
F. Puglisi,
2017
.
K. Pey,
N. Raghavan,
S. O’Shea,
2019,
2019 8th International Symposium on Next Generation Electronics (ISNE).
S. O’Shea,
I. Vakarelski,
Xiaosong Tang,
2010,
Advanced materials.
M. Welland,
J. Pethica,
S. O’Shea,
1994
.
J. McBride,
G. Bhattacharya,
S. O’Shea,
2018,
Carbon.
D. Chan,
S. O’Shea,
J. W. Kwek,
2009,
Langmuir : the ACS journal of surfaces and colloids.
H. Bhaskaran,
D. Daniel,
A. Miserez,
2022,
ACS nano.
P. Lu,
S. O’Shea,
Xiaosong Tang,
2011
.
Ziqiang Zhu,
S. O’Shea,
Jian Zhang,
2004
.
A. Wee,
S. O’Shea,
L. Lim,
2009,
The Journal of chemical physics.
S. O’Shea,
R. Lim,
2004,
Langmuir : the ACS journal of surfaces and colloids.
Sam F. Y. Li,
S. O’Shea,
R. Lim,
2002
.
Samarendra P. Singh,
S. O’Shea,
W. Hofbauer,
2011
.
A. Padovani,
K. Pey,
Y. Ang,
2023,
ACS Applied Electronic Materials.
R. Dagastine,
D. Chan,
G. Stevens,
2008,
Physical review letters.
S. O’Shea,
X. Su,
K. T. Chong,
2002
.
S. O’Shea,
X. Su,
J. Zhang,
2002,
Biophysical chemistry.
Yan Peng Liu,
K. Loh,
Ang Li,
2015,
Physical review letters.
K. Pey,
C. Tung,
D. Ang,
2008
.
H. Iwai,
K. Pey,
K. Kakushima,
2008
.
Jian Zhang,
Xiaodi Su,
S. O’Shea,
2002,
Biosensors & bioelectronics.
Sean J. O’Shea,
Pin Lu,
P. Lu,
2004
.
K.H. Lee,
P. Lu,
S. O’Shea,
2002,
Proceedings of IEEE Sensors.
Nagarajan Raghavan,
Michel Bosman,
Kin Leong Pey,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
Hiroshi Iwai,
Nagarajan Raghavan,
Kuniyuki Kakushima,
2011
.
Nagarajan Raghavan,
Alok Ranjan,
Kin Leong Pey,
2016,
Microelectron. Reliab..
Hiroshi Iwai,
Kuniyuki Kakushima,
Michel Bosman,
2014
.
Nagarajan Raghavan,
Michel Bosman,
Kin Leong Pey,
2013
.
K. Kakushima,
H. Iwai,
Z. R. Wang,
2011,
2011 International Reliability Physics Symposium.
H. Iwai,
K. Pey,
K. Kakushima,
2008
.
Hiroshi Iwai,
Cedric Troadec,
Kuniyuki Kakushima,
2007
.
B. Tay,
J. Miao,
E. Teo,
2008,
IEEE Sensors Journal.
Y. Ong,
K. Pey,
A. Wee,
2008
.
D. Ritchie,
W. Tribe,
M. Simmons,
2002
.
Xiaodi Su,
Sam F. Y. Li,
S. O’Shea,
2001
.
S. O’Shea,
R. Lim,
2002,
Physical review letters.
K. Pey,
N. Raghavan,
M. Bosman,
2015,
2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits.
S. Kruchinin,
A. Fujiwara,
S. O’Shea,
2011
.
Heow Pueh Lee,
Chun Lu,
Pin Lu,
2005
.
Nagarajan Raghavan,
Alok Ranjan,
Michel Bosman,
2016,
Microelectron. Reliab..
S. O’Shea,
W. Hofbauer,
N. Gosvami,
2009
.
S. Sinha,
S. O’Shea,
W. Hofbauer,
2007,
The Journal of chemical physics.
F. Tay,
A. Wee,
S. O’Shea,
2002
.
K. Pey,
S. O’Shea,
A. Ranjan,
2019,
The Review of scientific instruments.
M. Lantz,
M. Welland,
S. O’Shea,
1997
.
Nagarajan Raghavan,
Kin Leong Pey,
Kalya Shubhakar,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
P. Lu,
S. O’Shea,
2012
.
Sam F. Y. Li,
S. O’Shea,
Y. Xing,
2005
.
T. Y. Ng,
Sean J. O’Shea,
Pin Lu,
2001
.
Lu Shen,
P. Lu,
Y. Foo,
2011
.
K. Pey,
N. Raghavan,
M. Bosman,
2020,
ACS applied materials & interfaces.
B. Tay,
W. Milne,
J. Miao,
2004
.
M. Srinivasan,
S. Sinha,
S. O’Shea,
2008
.
N. Raghavan,
K.L. Pey,
M. Bosman,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
A. Ranjan,
N. Raghavan,
K. Shubhakar,
2018,
Scientific Reports.
S. O’Shea,
W. Hofbauer,
N. Chandrasekhar,
2007
.
Cher Ming Tan,
Arijit Roy,
Sean J. O'Shea,
2007,
Microelectron. Reliab..
A. Padovani,
K. Pey,
N. Raghavan,
2023,
ACS Applied Electronic Materials.