Xiaosong Li

Transversal and longitudinal noise and their coherence in MOST

L. Vandamme, Xiaosong Li, 1993 .

1/f noise in MOS devices, mobility or number fluctuations?

L.K.J. Vandamme, D. Rigaud, L. Vandamme, 1994 .

1/f Noise in MOS devices: Mobility or number fluctuations? (invited)

K., Xiaosong Li, D. Rigaud, 2004 .

Parameter extraction and 1/f noise in a surface and a bulk-type p-channel LDD MOSFET

E. P. Vandamme, L.K.J. Vandamme, E. Vandamme, 1994 .

Change of 1/f noise in MOSFETS due to degradation

L. Vandamme, Xiaosong Li, 1994, International Electron Devices and Materials Symposium.

1/f noise in MOS transistors due to number or mobility fluctuations

L. Vandamme, Xiaosong Li, D. Rigaud, 2008 .

noise in series resistance of LDD MOSTs

L. Vandamme, Xiaosong Li, L.K.J. Vandamme, 1992 .