J. Mitard

发表

G. Groeseneken, Luigi Pantisano, G. Hellings, 2012, Proceedings of Technical Program of 2012 VLSI Technology, System and Application.

G. Groeseneken, J. Mitard, F. Crupi, 2013, IEEE Transactions on Electron Devices.

P. Eyben, D. Mocuta, J. Mitard, 2016, 2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).

Cor Claeys, Eddy Simoen, C. Merckling, 2013, IEEE Transactions on Device and Materials Reliability.

B. Kaczer, G. Hellings, D. Linten, 2019, 2019 IEEE International Reliability Physics Symposium (IRPS).

B. Kaczer, T. Grasser, L. Witters, 2014, 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW).

L. Witters, N. Collaert, H. Bender, 2014, 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.

G. Ghibaudo, F. Andrieu, T. Ernst, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

G. Hellings, L. Witters, D. Linten, 2012, Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012.

B. Kaczer, Z. Ji, J. Mitard, 2014, 2014 IEEE International Electron Devices Meeting.

A. Mercha, L. Witters, J. Mitard, 2010, 2010 International Electron Devices Meeting.

B. Kaczer, L. Witters, N. Collaert, 2016, 2016 IEEE Symposium on VLSI Technology.

A. Brand, P. Eyben, L. Witters, 2014, 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.

B. Kaczer, T. Grasser, L. Witters, 2013, IEEE Transactions on Electron Devices.

B. Kaczer, J. Mitard, G. Groeseneken, 2013, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

P. Eyben, G. Hellings, L. Witters, 2011, 2011 Symposium on VLSI Circuits - Digest of Technical Papers.

B. Kaczer, G. Hellings, J. Mitard, 2009, 2009 Proceedings of the European Solid State Device Research Conference.

L. Witters, N. Collaert, Z. Ji, 2015, 2015 Symposium on VLSI Technology (VLSI Technology).

X. Garros, G. Reimbold, G. Ghibaudo, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

B. Kaczer, T. Grasser, W. Goes, 2016, 2016 IEEE International Reliability Physics Symposium (IRPS).

R. Degraeve, B. Kaczer, T. Grasser, 2010, 2010 International Electron Devices Meeting.

J. Mitard, F. Crupi, G. Groeseneken, 2008, ESSDERC 2008 - 38th European Solid-State Device Research Conference.

B. Kaczer, G. Hellings, L. Witters, 2015, 2015 Symposium on VLSI Technology (VLSI Technology).

N. Collaert, J. Mitard, M. Jurczak, 2011, Proceedings of 2011 International Symposium on VLSI Technology, Systems and Applications.

B. Parvais, A. Vandooren, J. Ryckaert, 2018, 2018 IEEE International Electron Devices Meeting (IEDM).

L. Pantisano, E. Simoen, M. Nafria, 2009, IEEE Transactions on Electron Devices.

D. R. Ball, B. L. Bhuva, N. N. Mahatme, 2014, IEEE Transactions on Nuclear Science.

E. Simoen, C. Claeys, J. Mitard, 2011, IEEE Transactions on Electron Devices.

C. Merckling, D. Lin, N. Waldron, 2014, 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.

B. Kaczer, G. Hellings, L. Witters, 2012, 2012 IEEE International Reliability Physics Symposium (IRPS).

C. Ortolland, L. Witters, J. Mitard, 2011, IEEE Transactions on Electron Devices.

X. Garros, G. Reimbold, G. Ghibaudo, 2006, 2006 IEEE International Reliability Physics Symposium Proceedings.